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Wednesday, 27 February 2013 17:14

Product Brochures

Wednesday, 27 February 2013 14:38

Main Office and Distributor Contacts

 

NANONICS IMAGING HEADQUARTERS

Sales and Marketing

Nanonics Imaging is represented by an extensive global network of representatives. Scroll down to locate your local distributor information; distributors are organized by continent and country.  You are also always welcome to contact our headquarters directly for all your needs at the contact information listed direclty below:

Phone: +972 2 678 9573
Fax +972 2 648 0827
Email info@nanonics.co.il


To contact your local sales representative locate your region below:

North America

South America

Australia

Europe

Asia

Click here if you do not find the country you are looking for

 

 

North America

 


 USA

 

       
  Company:  Nanounity    
  Contact: Brad Rangell (Headquarters) and John Janzer (Eastern Office)    
  Phone: +1 408 235-8888; +1 215 766-0751    
  E-Mail: info@nanounity.com  
  Website:  

 

 

 

 

 

 Canada

     
  Company:  DELTA PHOTONICS    
  Contact: Rob Grant    
  Phone:  1-866-777-3366  
  E-Mail: rgrant@deltaphotonics.com    
  Website:  www.deltaphotonics.com

 

South America

 Argentina

       
  Company:    AGSENS    
  Contact:   Juan Aguilera    
  Phone:   5622695 0836    
  E-Mail:   info@agsens.cl    
  Website:   http://www.nanonics.co.il/contact-information/sales-contacts.html
 

 Brazil

       
  Company:   Insight Tecnica    
  Contact:  

Michael Dean Buckley

Rua Artur Azevedo, 2008
São Paulo -SP - Brasil
CEP 05404-005 

 

 
  Phone:  

Brasil: +55 1130429127

US: +01 858 997 0768

   
  E-Mail:   info@insighttecnica.com    
  Website:   http://www.insighttecnica.com/    
 

 Chile

       
  Company:   AGSENS    
  Contact:   Juan Aguilera    
  Phone:   56226950836    
  E-Mail:   info@agsens.com  
  Website:  

http://www.nanonics.co.il/contact-information/sales-contacts.html

   

http://www.nanonics.co.il/contact-information/sales-contacts.html

 

 

Australia

 Australia

       
  Company:   LASTEK PTY LTD     
  Contact:   Anthony Quinn    
  Phone:   +61 8 84438668     
  E-Mail:   aquinn@lastek.com.au    
  Website:   www.lastek.com.au    

Europe

 Austria

       
  Company:    SOLITON    
  Contact:    Toni Beckmann    
  Phone:    08105 7792 0    
  E-Mail:   t.beckmann@soliton-gmbh.de    
  Website:   www.soliton-gmbh.de    

 Cyprus

       
  Company:   A N E L I S  E.E.      
  Contact:   Lefteris Klothakis    
  Phone:   +30 210 7524444    
  E-Mail:   eklot@anelis.gr    
  Website:   www.anelis.gr    

 Czech Republic

       
  Company:    SOLITON    
  Contact:    Toni Beckmann    
  Phone:    08105 7792 0    
  E-Mail:   t.beckmann@soliton-gmbh.de    
  Website:   www.soliton-gmbh.de.com    

 Greece

       
  Company:   A N E L I S  E.E.      
  Contact:   Lefteris Klothakis    
  Phone:   +30 210 7524444    
  E-Mail:   eklot@anelis.gr    
  Website:   www.anelis.gr    

 Germany

       
  Company:    SOLITON    
  Contact:    Toni Beckmann    
  Phone:    08105 7792 0    
  E-Mail:   t.beckmann@soliton-gmbh.de    
  Website:   www.soliton-gmbh.de    

 Ireland

       
  Company:   SEMIMETRICS LTD.     
  Contact:   Eric Don    
  Phone:   0191 232 3950    
  E-Mail:   eric.don@semimetrics.com  
  Website:   www.semimetrics.com    

 Lithuania 

       
  Company:

UAB "EXPERTUS VILNENSIS"

     
  Contact: Arvidas Neniskis      
  Phone: +370 5 2729374 Mobile: +370 687 41630      
  E-Mail: arvidas@exvil.lt      
  Website: www.exvil.lt      

 Netherlands 

 

     
  Company:   K-ANALYS AB    
  Contact:   Lars Halldahl  
  Phone:   + 46 18 590 575  
  E-Mail:   lars.halldahl@kagaku.se  
  Website:   www.k-analys.se

 Poland

       
  Company:    SOLITON    
  Contact:    Toni Beckmann    
  Phone:    08105 7792 0    
  E-Mail:   t.beckmann@soliton-gmbh.de    
  Website:   www.soliton-gmbh.de    

 Romania

       
  Company:   RONEXPRIM S.R.L     
  Contact:   Mihai Balas    
  Phone:   +40(21)314 35 99; +40(21)314 35 98 Mobile: +40 722 662 752    
  E-Mail:   mb@ronexprim.com    
  Website:   www.ronexprim.com    

 Scandinavia 

 

     
  Company:   K-ANALYS AB    
  Contact:   Lars Halldahl  
  Phone:   + 46 18 590 575  
  E-Mail:   lars.halldahl@kagaku.se  
  Website:   www.k-analys.se

 Spain

       
  Company:   SCIENTEC     
  Contact:   Javier Ledesma    
  Phone:   +34610453275    
  E-Mail:   jledesma@scientec.es    
  Website:   www.scientec.es    

Switzerland

       
  Company:   DYNEOS AG     
  Contact:   Stephen Zurcher    
  Phone:   +41-52-355-12 40    
  E-Mail:   info@dyneos.ch    
  Website:   www.dyneos.ch    

 UK

       
  Company:   SEMIMETRICS LTD.     
  Contact:   Eric Don    
  Phone:   0191 232 3950    
  E-Mail:   eric.don@semimetrics.com    
  Website:   www.semimetrics.com    

           
           
         

 

 

 

Asia

 China 

       
  Company:    K-ANALYS TRADING (SHANGHAI)    
  Contact:    Yanlin Xu   Vicky Yuan 
  Phone:    +86 13816461476   +86 21 5836 2582
  E-Mail:   yanlin.xu@k-analys.se   vicky.yuan@k-analys.se
  Website:   www.k-analys.se    

Hong Kong 

       
  Company:   GUY LEUNG GUYLINE     
  Contact:   Wendy Lai    
  Phone:   +852 2856 0606     
  E-Mail:   wendy@guyline.com.hk    
  Website:   www.guyline.com.hk    

 India

       
  Company:   LABINDIA INSTRUMENTS PVT. LTD.     
  Contact:   Samik Pal    Hemant Borgaonkar
  Phone:   +852-2856-0606    +91 22 25986062
  E-Mail:   samikp@labindia.com   borgaonkarhv@labindia.com
  Website:   www.labindia.com    

 Japan

       
  Company:   TOMOE ENGINEERING     
  Contact:   Akifumi Kobayashi    
  Phone:   +81 3 5435 6516    
  E-Mail:   akobayashi@tomo-e.co.jp    
  Website:   http://www.tomo-e.co.jp/index_e.html
 

 

 Korea

       
  Company:   CnH Tech    
  Contact:   Chulsu Kim    
  Phone:   +82 2 6352 9920    
  E-Mail:   cskim@cnhtech.co.kr    
  Website:   www.cnhtech.co.kr    

 

 Malaysia

       
  Company:   ALPHA INSTRUMENTS   EMANUEL SDN BHD 
  Contact:   Fuad Rahman   Chai Kok
  Phone:   HP: +6012-6246438   +60389435090
  E-Mail:   a.fuadrahman@alphaiss.com.my   chaikok1234@yahoo.com
  Website:   www.alphaiss.com.my/   http://www.alphaiss.com.my

 Singapore

       
  Company:   EINST TECHNOLOGY PTE LTD    
  Contact:   Weelee Tok    
  Phone:   +65 9656 8953    
  E-Mail:   weelee@einstinc.com    
  Website:   www.einstinc.com/    

 Taiwan

       
  Company:   PROTRUSTECH CO. LTD    
  Contact:   Dr. Bluse Chen    
  Phone:  

Taiwan Office: +886 6 2892081

Taipei Office: +886 2 29995339
   
  E-Mail:   service@protrustech.com    
  Website:   www.protrustech.com/    

 

Middle East

 Israel

       
  Company:   NANONICS IMAGING LTD. HEADQUARTERS    
  Contact:   Sales & marketing    
  Phone:   +972 2 678 9573    
  E-Mail:   info@nanonics.co.il    
  Website:   http://www.nanonics.co.il/    

 

Rest of the world

 

           
  Company:   Nanonics Imaging Ltd.    
  Contact:    Sales and Marketing    
  Phone:   Phone: +972-2-678-9573    
  E-Mail:   info@nanonics.co.il  
  Website:    http://www.nanonics.co.il  

 

 

Wednesday, 27 February 2013 14:36

Nanonics Offices

For contact information on Nanonics head office and US office

Wednesday, 27 February 2013 13:40

AFM SECM

AFM Integration with Scanning Electro Chemical Microscopy

Tuesday, 26 February 2013 12:15

PMMA - Topographic and Phase Measurements

Topographic and Phase Measurements 

 

Scan range: 1x1microns

Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400 Resonance Frequency of Probe 50 KHz on a Renishaw Raman MicroSpectrometer.

 

Topographic Image

 

Phase Measurement

The sensitivity of the phase image is shown by the differential imaging of different chemical constitution (see contrast of red and green arrow relative to blue arrow indicating the background. Such an effect is only seen in the phase image but not the topography image.

Line Scan of the Topographic Image  

 

   

 

Line Scan of the Phase Image

 

   

 


Topographic and Phase Measurements

Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400. Same probe was used as in the first set of measurements, but at a different place on the sample.

 

Topographic Image

 

Phase Measurement


Line Scan of the Topographic Image

 

   

 

Line Scan of the Phase Image

 

   

Topographic and Phase Measurements

Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-2000 Resonance Frequency of Probe 36 KHz on a Renishaw Raman MicroSpectrometer.

 

 

Topographic Image

 

Phase Measurement

Topographic and Phase Measurements

Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400 Resonance Frequency of Probe 145 KHz on a Renishaw Raman MicroSpectrometer.

 

Topographic Image

 

Phase Measurement

Topographic and Phase Measurements

Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400
Same probe was used as in the previous set of measurements, but at a different place on the sample.

 

Topographic Image

 

Phase Measurement

Tuesday, 26 February 2013 12:01

GProtein

GProtein Lines

     

2.5X2.5 micron AFM of Printed G Protein

 

AFM of Printed GFP

     
    Only Nanonics can deliver chemicals or gas onto a sample on line, with no need to remove the tip from the sample.
25 X 20 micron NSOM image of printed GFP    

 

 

 A movie of online protein printing is shown on the left.

 


 

 
 

Nanofountain Pen reviewed by Nature Materials

In the August 2003 edition of Nature Materials. The Nanofountain Pen was reviewed in the Material Update section.

Click to download application note on the uses of the nanofountain pen (331kB)

Tuesday, 26 February 2013 11:32

Fibroblast Cells imaging

AFM/NSOM Imaging of Fibroblast Cells in Liquid Cell

 
(A) AFM  topographic imaging with simultaneous NSOM imaging (B) with an AFM/NSOM cantilevered fiber probe at transmission mode (50x objective    of an inverted optical microscope) in liquid cell AFM of similar fibroblast cells with an AFM nominally designed for BioAFM

Topography (Left) and NSOM Images (Right). Scan Range 50x50 Microns 

Unparalleled Scanned Probe Cellular Imaging 
Fully Integrated with Optical Microscopy

 

CCD image of the sample with SPM/NSOM probe at the cell surface. The point of SPM imaging can be seen clearly in the optical microscope.
 

  

NSOM image of 50x50 µm 

NSOM image of 50x50 µm 

 NSOM image of 8x8 µm

These images illustrate the ability of Nanonics' MultiView systems to overcome the difficulties usually associated with viewing live, soft tissue liquid samples. Nanonics' SPM systems allow facile viewing of liquid samples via a versatile and user-friendly liquid cell attachment. The open architecture of Nanonics' SPM heads allows the user to view samples from above and below. These systems are easily integrated into Nanonics' dual microscope which combines both upright and inverted formats. This is particularly important for better resolution of low-contrast biological samples.

The free optical axes also allows fluorescence and Raman imaging to be achieved with ease.

With the same system AFM was employed for topographical mapping. The AFM was completed in intermittent contact mode, as regular contact mode would have scratched the soft tissue. Nanonics' systems are able to operate in all three SPM modes.

Tuesday, 26 February 2013 10:08

What is SNOM?

SNOM (Scanning Near-Field Optical Microscopy) is an alternative name for NSOM (Near-Field Scanning Optical Microscopy).

The basic principle of SNOM near-field optics: Light passes through a sub-wavelength diameter aperture and illuminates a sample that is placed within its near field, at a distance much less than the wavelength of the light. The resolution achieved is far better than that which conventional optical microscopes can attain.

Nanonics Imaging Ltd. is the world leader in the production of SNOM systems.

Some Nanonics SNOM systems include:

The MultiView 1000™- Sample-scanning SNOM Microscope.

The MultiView 2000™- The first ever combined tip- and sample-scanning SNOM system.

The MultiView 4000™- The most advanced Nanonics Multiview system.

CryoView MP™- The first commercial Low-Temperature SNOM system with free optical access. 

 

 

1. Failure analysis of microchips and chemically mechanically polished microchips

NSOM (SNOM) Overview

The limits of far field imaging

In the early 1870s, Ernst Abbe formulated a rigorous criterion for being able to resolve two objects in a light microscope: 
d > λ / (2sinθ)

where d = the distance between the two objects, λ = the wavelength of the incident light, and 2θ = the angle through which the light is collected. 

 

Find the Scanning Probe Microscope that's right for you.

 

Explore the possibilities - today!

 

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Let's set up a time to speak briefly about your unique SPM needs.

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