Dual Probe Electrical Measurements Multiview 4000TM allows for unique online multiprobe electrical measurements through it’s accurate/nanometric manipulation and imaging capabilities. Up to four online probes are readily used with flexible positioning and nanomanipulation for localized providing bias, I-V localized measurements and multichannel imaging. The pictures above show a two probe electrical imaging of grooved Au coated surface on glass. One probe was used to bias the surface and a second probe for AFM/Electrical imaging.
Nanonics' ultrastable solid wire electrical probes allow for low contact resistance of a few tens of ohms and full insulation with glass up to the probe tip for high electro-potential resolution. Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging. Finally, the probe with its high cantilever design minimizes cantilever electrical interference.The properties of these electrical probes include:• Ultrastable solid nanowires with exposed probe tips • Low contact resistance and full insulation with glass up to the probe tip for high electro-potential resolution • Glass coating insulation which can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging. • High cantilever design that minimizes cantilever electrical interference
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Dual Probe Optical Measurements
With two cantilevered, near-field optical probes with exposed tips, optical pump/probe experiments can now be performed. In this example light is injected through one probe and is guided through the sample which is a fiber. With the second probe in place, this injected light can be collected and analyzed both spatially and temporally.A diagramatic illustration is displayed above with a bright field optical microscopic image shown to the left. In this image two NSOM probes are seen in AFM contact with the input and output of the fiber waveguide. In the dark field image, the injected light from the illuminating 100nm near-field optical probe on the right is seen as a small spot of reflected light from the waveguide. This injected light is then guided through the fiber, and the intense spot on the left in the dark field image is collected and analyzed, both spatially and temporally, at the output of the waveguide with a second probe whose silhouette is clearly seen. |
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AFM Integration with Scanning Electro Chemical Microscopy
Topographic and Phase Measurements
Scan range: 1x1microns
Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400 Resonance Frequency of Probe 50 KHz on a Renishaw Raman MicroSpectrometer.
Topographic Image |
Phase Measurement |
The sensitivity of the phase image is shown by the differential imaging of different chemical constitution (see contrast of red and green arrow relative to blue arrow indicating the background. Such an effect is only seen in the phase image but not the topography image.
Line Scan of the Topographic Image
Line Scan of the Phase Image
Topographic and Phase Measurements
Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-400. Same probe was used as in the first set of measurements, but at a different place on the sample.
Topographic Image |
Phase Measurement |
Line Scan of the Topographic Image
Line Scan of the Phase Image
Topographic and Phase Measurements
Measurements were done using Nanonics AFM probe with tip diameter 10 nm and SPM MV-2000 Resonance Frequency of Probe 36 KHz on a Renishaw Raman MicroSpectrometer.
Topographic Image |
Phase Measurement |
Topographic and Phase Measurements
Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400 Resonance Frequency of Probe 145 KHz on a Renishaw Raman MicroSpectrometer.
Topographic Image |
Phase Measurement |
Topographic and Phase Measurements
Measurements were done using Si probe with tip diameter 10 nm on an SPM MV-400
Same probe was used as in the previous set of measurements, but at a different place on the sample.
Topographic Image |
Phase Measurement |
2.5X2.5 micron AFM of Printed G Protein |
AFM of Printed GFP |
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Only Nanonics can deliver chemicals or gas onto a sample on line, with no need to remove the tip from the sample. | ||
25 X 20 micron NSOM image of printed GFP |
A movie of online protein printing is shown on the left. |
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AFM/NSOM Imaging of Fibroblast Cells in Liquid Cell
(A) AFM topographic imaging with simultaneous NSOM imaging (B) with an AFM/NSOM cantilevered fiber probe at transmission mode (50x objective of an inverted optical microscope) in liquid cell | AFM of similar fibroblast cells with an AFM nominally designed for BioAFM |
Topography (Left) and NSOM Images (Right). Scan Range 50x50 Microns
Unparalleled Scanned Probe Cellular Imaging
Fully Integrated with Optical Microscopy
CCD image of the sample with SPM/NSOM probe at the cell surface. The point of SPM imaging can be seen clearly in the optical microscope. |
NSOM image of 50x50 µm |
NSOM image of 50x50 µm |
NSOM image of 8x8 µm |
These images illustrate the ability of Nanonics' MultiView systems to overcome the difficulties usually associated with viewing live, soft tissue liquid samples. Nanonics' SPM systems allow facile viewing of liquid samples via a versatile and user-friendly liquid cell attachment. The open architecture of Nanonics' SPM heads allows the user to view samples from above and below. These systems are easily integrated into Nanonics' dual microscope which combines both upright and inverted formats. This is particularly important for better resolution of low-contrast biological samples.
The free optical axes also allows fluorescence and Raman imaging to be achieved with ease.
With the same system AFM was employed for topographical mapping. The AFM was completed in intermittent contact mode, as regular contact mode would have scratched the soft tissue. Nanonics' systems are able to operate in all three SPM modes.
SNOM (Scanning Near-Field Optical Microscopy) is an alternative name for NSOM (Near-Field Scanning Optical Microscopy).
The basic principle of SNOM near-field optics: Light passes through a sub-wavelength diameter aperture and illuminates a sample that is placed within its near field, at a distance much less than the wavelength of the light. The resolution achieved is far better than that which conventional optical microscopes can attain.
Nanonics Imaging Ltd. is the world leader in the production of SNOM systems.
Some Nanonics SNOM systems include:
The MultiView 1000™- Sample-scanning SNOM Microscope.
The MultiView 2000™- The first ever combined tip- and sample-scanning SNOM system.
The MultiView 4000™- The most advanced Nanonics Multiview system.
CryoView MP™- The first commercial Low-Temperature SNOM system with free optical access.
What technique are you looking for? We're confident we have a solution for you.
Or simply contact us and one of our applied scientists will help guide you to the right product for your research or industry:
Yes, I'd like to discuss Apertureless NSOM with an application scientist
Yes, I'd like to discuss Reflection NSOM with an application scientist
Yes, I'd like to discuss Collection NSOM with an application scientist
Yes, I'd like to discuss Transmission NSOM with an application scientist
Yes, I'd like to discuss Fluorescence NSOM with an application scientist
Yes, I'd like to discuss Nano-Illumination NSOM with an application scientist