Only Nanonics combined Raman and AFM system allows Raman spectra to be taken while an AFM tip is in contact with the sample.
Only Nanonics combined Raman and AFM system allows Raman spectra to be taken while an AFM tip is in contact with the sample.
|
This example demonstrates the use of the electrical features of the Nanonics glass probe based SPM sensors. The surface is flat and thus, there are no surface features that could indicate via the AFM topography where the pn junction is located but the resistivity image shows the resistance in two of the connected pn junctions. This data can be analyzed to give the carrier concentration. Only Nanonics can produce simultaneous Near-field optical and Electrical imaging These Images were produced using the The MultiView 1000™.
The Nanonics MultiView 1000™ is designed around the 3D Flatscan™ which has a completely free optical axis from above and below the sample. Nanonics uses NSOM cantilevered optical fiber probes which do not block the microscope objective. The metal coating of these probes allows them to be used for electrical measurementes while the aperture at their tips illuminates the sample in the near field.
|
AFM and Reflection NSOM of SRAM
These Images were produced using the The MultiView 1000™ . This is the only system available today which can produce reflection NSOM in the intermittent contact mode.
|
|
Dual Nano-Wire Thermal Conductivity Measurements
Nanonics has also developed Dual Wire Thermo-Resistance probes for use with the MultiView 4000™. In this specialized probe, two platinum wires are stretched through the nanopipette and are fused together at their tips. This fused junction has a resistance that is temperature-dependent. The unique probe allows for simultaneous measurement of surface topography and thermal conductivity even in intermittent contact mode. With multiple probes, heat can be introduced at specific locations and detected at other locations. The probes can also be used for resistance measurements. Only the MultiView 4000™ utilizing Dual Wire Thermo-Resistance probes with their exposed probe tip is capable of these functions.A thermal conductivity image of a static random access memory (SRAM) device is compared with the AFM topography. As contact is made in different regions of the SRAM with the thermal conductivity probe, the probe tip cools to different levels depending on the thermal conductivity of the material that is sitting under the chemically mechanically polished flat surface. The resulting image is obtained by determining the current alterations that had to be affected in order to keep the current flowing past the point resistance at a constant value.
Multiprobe Optical and Thermal Profiling
The MultiView 4000™ System simplifies the task of optically and thermally profiling on-line an optoelectronic device. Seen in these images (above) are the optical distribution of light in a quantum wire laser (NSOM) and the thermal distribution around the laser. The image below includes the p contact region in the thermal image. As can be seen, the thermal and light distribution bear no correlation to one another, but rather the thermal distribution is bowed towards the p contact where electrical charge is injected. |
MultiProbe NanoChemical Writing Fountain Pen Nanolithography (FPN) pipette probe allows for chemical nanowriting with one probe of the Multiview 4000TM system. A second AFM probe is used SPM imaging of the deposited materials. Letf: shows a nanopipette probe delivering a BSA protein on an aldehyde modified surface. Middle: shows the feature being imaging with a second AFM probe for obtaining the topography of the deposited BAS (right). With the Nanonics Fountain Pen Nanolithography [FPN] System, it is now possible to perform chemical nanolithography via liquid and gas delivery to the sample using the Nanonics' patented nanopipetteprobe, which acts simultaneously as an AFM tip and online delivery system. All Nanonics’ MultiViewTM SPM systems allow for FPN including the MultiView4000TM Multi-probe systems. |
MultiProbe Apertureless NSOM
Multiprobe Apertureless NSOM/ sSNOM: Efficient excitation of a plasmonic structure using an apertured NSOM probe (right probe) which produces all k vectors for effective plasmonic excitation while monitoring the same structure with a scattering probe (left probe). Right: Plasmonic propagation excited by an apertured NSOM probe while a second, low dielectric, non-perturbing, apertureless, fluorescent tipped probe is used for detection of the plasmon propagation |
Dual Probe Nanoindentation with On-line AFM/Raman Profiling
The images above show the utility of two probes on-line in nanoindentation experiments. With the nanoindentation shown here it would be impossible to perform the imaging task with only the indenting probe. It also shows the great utility of the optically friendly nature of the multi probe system which in this case permits an on-line Raman map for chemically characterizing the nanoindentation. All Nanonics MultiView Systems can be integrated with any optical or electron/ion optical microscope system |
|
What technique are you looking for? We're confident we have a solution for you.
Or simply contact us and one of our applied scientists will help guide you to the right product for your research or industry:
Yes, I'd like to discuss Apertureless NSOM with an application scientist
Yes, I'd like to discuss Reflection NSOM with an application scientist
Yes, I'd like to discuss Collection NSOM with an application scientist
Yes, I'd like to discuss Transmission NSOM with an application scientist
Yes, I'd like to discuss Fluorescence NSOM with an application scientist
Yes, I'd like to discuss Nano-Illumination NSOM with an application scientist