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CLEO, May 8-10, 2012, San Jose, CA    NT12, June 25-28, 2012, Brisbane, Australia    ICN+T 2012, July 23-27, 2012, Paris, France    Nanonics Imaging Hosts User Workshop during CLEO Conference in San Jose, CA    
 
123123NSOM SNOM Confocal Solutions
Nanonics provides the largest range of NSOM and SNOM reflection, transmission and collection systems, all of which are fully integrated into all standard optical microscopes.
AFM Raman and TERS. Awarded the Semiconductor International award.
Perform integrated AFM imaging and micro-Raman spectroscopy with Tip Enhanced Raman Spectroscopy, using Nanonics' unique TERS probes.
Dual and MultiProbe AFM NSOM SNOM Systems. Awarded the Semiconductor International and R&D 100 2007 awards.
Image and manipulate samples with up to four independently controlled probes. Fully integrated with standard optical microscopes including micro-Raman.
AFM NSOM - SEM FIB Combinations
Achieve complementary and transparent operation of both SEM and AFM imaging techniques in one system. A powerful combination of SEM imaging speed with AFM topographical information.
The HydraThe Hydra BioSPM. Awarded Microscopy Today's MT-10 Award
A new breakthrough in BioAFM, the Hydra resolves many of the limitations of BioAFM, opening new horizons for the application of AFM in biology.
dual microscopePhotonics Solutions, 3D Profiling, Refractive Index. Awarded the R&D 100 2007 award.
The Optometronic 4000 integrates Nanonics' multiprobe, near-field optical & atomic force capabilities with Nanonics' lensed fibers and highly compact lensed fiber NanoManipulators.
Low Temperature AFM NSOM Confocal Solutions
Nanonics' Cryogenic AFM NSOM system with completely free optical axis for unobstructed viewing of the sample and the probe from above and below. This system allows for sample temperatures as low as 10 Kelvin.
Gas and Liquid FountainPen NanoLithography
Nanonics' NanoFountainPens provide for various unique applications including nanolithography chemical writing, metallic lines on non-conducting surfaces and protein printing.
Complete and Affordable AFM Packages
Introductory level AFM systems - including The Academia -for providing standard AFM modes of operation.
The Ultimate NanoToolKit
Specialized cantilevered glass probes developed for use with Nanonics' systems, including: Glass insulated NanoWire electrical probes; Nanoheater thermal conductivity; and gas & liquid NanoFountainPen probes.
Latest News
Nanonics Imaging Hosts User Workshop during CLEO Conference in San Jose, CA
Nanonics' Optometronic 4000 'SPM Technology at its finest'!...Read the full review on MicroscopeMaster
Nanonics Imaging Ltd. congratulates Prof. Robert W. Shaw and his colleagues on receiving the Applied Spectroscopy William F. Meggers Award at FACSS Conference in Reno, Nevada 2011
Nanonics' Live TERS Demo at CNSI Makes Web News
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Recent papers published by our customers
Recent papers published by our customers
• Synthesis and Dynamic Switching of Surface Plasmon Vortices with Plasmonic Vortex Lens
• Monitoring Intermediate States of Bacteriorhodopsin Monolayers Using Near-field Optical Microscopy
• Super-Resolution Imaging Using a Three-Dimensional Metamaterials Nanolens
• Combined Apertureless Near-field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection
• Experimental Investigation of Superfocusing of Plasmonic Lens with Chirped Circular Nanoslits
• A Direct-Write Approach for Carbon Nanotube Catalyst Deposition
• Negative Differential Resistance in Electrografted Layer of N-(2-(4-diazoniophenyl)ethyl-N
• Diodes Based on Bilayers Comprising of Tetraphenyl Porphyrin Derivative and Fullerene for Hybrid Nanoelectronics
• Diameter Dependence of the Minority Carrier Diffusion Length in Individual ZnO Nanowires
Providing tomorrow's systems for today's challenges
Nanonics Imaging Ltd. is the market leader of combined near-field optical microscopes (commonly referred to as either NSOM or SNOM systems) and atomic force microscopes (AFM). Incorporated in 1997, Nanonics is the longest established and most experienced supplier of such systems in the market, whose products have won several awards.
Advanced systems for multiprobe AFM/NSOM; low temperature NSOM/AFM; environmental chambers; chemical and gas delivery systems; and nano-lithography systems, provide our customers with an unparalleled choice of system configuration. Added to this are powerful imaging combinations such as combined AFM/NSOM/SEM and combined AFM/NSOM/micro-Raman systems, which allow our customers unique experimental set-ups for ground breaking applications.
All of this is complemented by in-house manufacture of the most comprehensive and unique range of scanned probe microscopy (SPM) probes including NSOM probes, micro-pipettes for thermal and electrical measurements, and probes for gas or liquid delivery.
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                                                                                                                   Patch Clamping | Photonic Band Gap | atomic force microscopy
                                                                                                                      scanning probe microscope | near field optics | NanoLithography