As many as four probes operate simultaneously and independently, with each probe having its own feedback and scanning capabilities. Measure sophisticated properties only possible with the availability of multiple probes such as electrical, thermal and optical properties of devices. The MultiView4000 is a novel platform containing multiple probes/AFMs for advanced experiments such as: nanoscale transport, optical pump-probe, and read-write experiments. The MultiView4000 continues the tradition of the MultiView series, providing total optical flexibility and customization possibilities. Now, AFM Raman and Tip Enhanced Raman Spectroscopy (TERS) can be integrated with multiprobe capability. In addition, free optical access from above allows easy visualization of all probes and facilitates nanomanipulation.

MV4000Page

Key Features

Simultaneously Characterize Multiple Dimensions

The simultaneous and independent SPM probe operation of up to 4 probes enables full characterization of all dimensions of samples and devices. All forms of SPM are enabled for each individual probe accompanied by total optical integration resulting in access to all modes including AFM, KPM, EFM, ANSOM, NSOM, STM, AFM-Raman, and TERS. Because these probes are designed for multiple probe operation, they can be brought to a nanometric separation distance thus ensuring that the same area is scanned with all the probes.

Nanoscale Transport

One probe can be the source of excitation while the second probe follows the transport process with high spatial resolution. Alternatively, optical pump/probe experiments can now be performed using one probe to optically pump while the other probe measures the optical output in a variety of configurations. An example of each type of measurement is shown below.

1. Thermal transport measurement within an SRAM device where heat is introduced at specific locations and detected at other locations. As contact is made in different regions of the SRAM with the thermal conductivity probe, the probe tip cools to different levels depending on the material's thermal conductivity. The resulting image is obtained by determining the current alterations that had to to be affected in order to keep the current flowing past the point resistance at a constant value.

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2. With two cantilever, near-field optical probes with exposed tips, light is injected through one probe and is guided through the sample which is a fiber. With the second probe in place, this injected light can be collected and analyzed both spatially and temporally. In this image two NSOM probes are seen in AFM contact with the input and output of the fiber waveguide.

Dual Probe Optical Measurements

Nanoscale Manipulation and Measurement

One probe can be used for moving, cutting, or positioning a sample, while the other probe can be used to image the sample. For example, shown below is a chromosome that has been dissected with one probe (see image on left), while the other probes images the result of the nanomanipulation.

nanomanipulation

Spatially Friendly Glass Probes

While typical probes do not permit close proximity of probe tips, Nanonics has developed spatially and optically friendly glass based probes that allow for a close approach of the probe tips to within nm, as well as independent scanning of each probe. Nanonics' glass based probes offer excellent imaging in AFM modes, unparalleled aspect ratios, and support deep trench imaging as well as side wall imaging. They also permit singular electrical imaging and thermal imaging with glass encased nanowires.

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Left: Nanonics' patented bent cantilevered glass probe

Center: Online dual probes in contact with AFM feedback (side view)

Right: Online four probes in contact with AFM feedback (top view 500x magnifications)

 

Free Optical Axis from Above the Probe

The MultiView 4000 offers a completely free optical axis from above the probe, below the sample and 270 degrees around the probe. The Multiview 4000 boasts a 4.5mm working distance from above the probe for ultrahigh resolution optical or electron/optical viewing probes on opaque samples.

Probe Station for Electrical Measurements

Multiprobe capability is especially useful for electrical measurements since multiple probes can now be placed over the element to provide bias or probe its conductivity, resistance, etc just like in a probe station. Two-, three-, or four-point resistance measurements are possible. Multiple probes also enable flexible positioning and manipulation to provide bias, localized I-V measurements, and multichannel imaging.

Integrate SPM Modes with Topography

With a multiprobe system, resolution and tip quality no longer need to be compromised since each probe is now individualized for each measurement. In classic NSOM setups the NSOM probe would have the dual function of imaging topography and fluorescence where the topography image is compromised by the aperture (wider diameter) needed by the NSOM probe. But in a multiprobe setup, a standard SPM probe can be used the topography without affecting the NSOM fluorescence measurement.

 

Tischlermultiprobe

The left and center images are the topography and fluorescence images, respectively, of lumogen dye particles collected in a multiprobe setup with different probes for topography and NSOM. The image on the right is the topography image of the same sample but collected with the NSOM probe, revealing the clear loss of resolution and morphology. The width of each image is 8um.

Modular Design for Easy Upgrade

The unique, modular design of the MultiView 4000 allows for the upgrade from one probe to two, three or four probes. 

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Start with 1 probe

 

 

 

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Upgrade to 2 probes

 

 

 

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Upgrade to 4 probes

Unique 3D Flatscan Scanner Technology

3Dflatscan top 2 143The design of the 3D Flatscan is a novel planar, folded-piezo flexure scan design that keeps the probes separated. The large vertical (axial) displacement of up to 100 microns allows for the use of multiple probes as well as the tracking of structures with very large topographical features. The minimal scanner height of 7mm allows for easy access with high powered microscope objectives from either above or below the scanning stages.

Ultra-sensitive Tuning Fork Feedback

Easy to use and ultimate force sensitivity with tuning fork feedback allowing soft approach of probes to one another for ultra-close positioning.

For a further explanation of this feedback mechanism, see our Tuning Fork Tutorial.

Tip & Sample Scanning Options

The MultiView 4000 provides both tip and sample scanning so that the user can select which mode of operation best suits their experimental needs. For example, a sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner. On the other hand, the tip scanning stage means that the tip can be scanned while the illumination point is held constant.

NSOM Integrations

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Raman Integrations

  • Integrate with a standard commercial Raman microprobe optical microscope with no intervening optical fibers
  • Background free Raman measurements
  • Laser-free tuning fork feedback method replaces laser-based feedback
  • Optically transparent cantilever glass probes
  • Perform tip enhanced Raman spectroscopy (TERS)
  • Cantilever nanopipette glass probes having single gold nanoparticles grown in tip
  • Full integration with upright, inverted or dual (4Pi) optical microscopes
  • Full integration with non-linear and multi-photon microscopes (e.g. second harmonic generation microscopes)
  • Completely free optical axis from above and below the sample
  • Complete freedom of optical microscopy nose piece rotation from above or below
  • Open system architecture providing transmission, reflection, and collection modes

Click on any feature to learn more

Multiple configurations

MV4000 Horiba XploRA

MV4000 - Horiba ExploRA Raman

MV 4000 Raman Int

MV 4000 - Raman Integration

Cryo Raman INT Crop

Transparent Raman Integration of Multiprobe Cryogenic System with Renishaw MicroRaman

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Transparent Raman Integration of Multiprobe Cryogenic System even with Nanonics or Commercial MicroRamans

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Raman Integration

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MultiView 4000TM/Renishaw Invia Raman Integration Package

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MultiView 4000TM/HORIBA Xplora Raman Integration Packag

SEM/FIB Integrations

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MV 4000 SEM FIB Int2

Environmental Chamber

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  • Multiprobe operation inside environmental chamber
  • Free optical axis from top and bottom - complete optical integration with dual optical microscope
  • Vacuum control
  • Gas inlets/outlets
  • T control - heating and cooling

Contact a Nanonics Specialist to Discuss Your Specific Needs

We are happy to answer all questions and inquiries

Images

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MultiView 4000 four SPM probes platform

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MultiView 4000 Tip and Sample scanning stages

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Optical image of online four SPM probes in feedback.

Videos

MV4000 Integrated with Chamber

High Resolution Nanolithography with MultiProbe 

Prof. Nancy Haegel: "Integrating Near-Field and Electron Optics..."

Watch 4 Probes Operate Simultaneously

Publications

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