MultiProbe AFM

In-situ Measurements for Nanoscale Characterization

Border MP HOME2

The invention of AFM introduced the ability to characterize samples with a wide variety of techniques at the nanoscale, now comes the next evolution of MultiProbe AFM.  With the ability to employ a wide variety of SPM probes nanometers from each other, transport scales can be studied on the nanoscale with a flexibility and ease not available before.  This state of the art instrument offers nanoscale transport measurements for optical, electrical, and thermal measurements.  Or use a high resolution AFM probe with another dedicated SPM probe to get the highest AFM resolution in every SPM measurement.  With full optical integration the MV 4000 is a real workstation for nanoscale characterization. 

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