Dual Probe Electrical Measurements Multiview 4000TM allows for unique online multiprobe electrical measurements through it’s accurate/nanometric manipulation and imaging capabilities. Up to four online probes are readily used with flexible positioning and nanomanipulation for localized providing bias, I-V localized measurements and multichannel imaging. The pictures above show a two probe electrical imaging of grooved Au coated surface on glass. One probe was used to bias the surface and a second probe for AFM/Electrical imaging.
Nanonics' ultrastable solid wire electrical probes allow for low contact resistance of a few tens of ohms and full insulation with glass up to the probe tip for high electro-potential resolution. Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging. Finally, the probe with its high cantilever design minimizes cantilever electrical interference.The properties of these electrical probes include:• Ultrastable solid nanowires with exposed probe tips • Low contact resistance and full insulation with glass up to the probe tip for high electro-potential resolution • Glass coating insulation which can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging. • High cantilever design that minimizes cantilever electrical interference
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