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Wednesday, 20 February 2013 09:46

AFM Raman of Si SiO2



Online AFM/Raman images of an Si/SiO2 grid shows a high lateral resolution on the Raman map. Shown on the left is the topographic image; on the right is the online Raman map of the 520cm-1 band’s intensity.

  • Nanonics’ MultiViewTM SPM systems – with their 3D FlatScanTM scanners and cantilevered glass probes – provide a free optical axis for a friendly online combination of AFM and Raman spectroscopy using true confocal optical microscopes, including upright microscopes.
  • Online AFM/Raman allows for direct and true correlation between structural and chemical information of the inspected samples. In addition, it improves the Raman’s lateral resolution by removing out-of-focus light through the accurate maintenance of sample-objective distance using the AFM tip. Finally, online AFM/Raman corrects tilts caused by the normal tilting of samples.
  • Glass probes are critical for Si-based samples, to prevent any background caused by the tip, as in most standard AFM systems that use Si cantilevered probes.
  • A Tip & Sample-Scanning AFM system is ideal for this type of application, to obtain tip/laser positioning for accurate AFM/Raman correlation. Complete correlation is obtained, without the miss-matching that can occur due to the switching of microscope objectives.

Ideal Systems for this Application:

Wednesday, 20 February 2013 09:36

Raman of Polymer Quantum Dots


Wednesday, 20 February 2013 09:17

AFM Raman of Name Card

Simultaneously Obtained Topography and Raman Images of Name Card


Topography image

Raman image at 1547 cm-1

Raman image at 954 cm-1

Wednesday, 20 February 2013 09:10

AFM and NSOM of A Multi Mode Fibre




A) AFM topographic image of a cleaved multimode optical fiber obtained with AFM/NSOM probe. 
B) A correlating NSOM image in collection mode obtained simultaneously with (A). 
C) A 3D collage AFM/NSOM of the output optical distribution with exact correspondence to the surface’s topography


  • Near-field optical distribution of a multimode optical fiber launched with 532nm laser.

  • The Nanonics' 3D FlatScanTM stage allows for vertical mounting of the optical 

    fiber with a flexible geometry for optical microscopy integrations.

  • The sample is kept stationary along the scan to prevent any disturbance of the light propagation through the fiber. Nanonics systems with Tip-Scanning capabilities are ideal in such applications for true profiling of the optical output. 
  • The AFM/NSOM fully correlated imaging is based on tuning fork feedback in normal mode.



Nanonics Nano3D Distortion Free, Near-field/Far-field  Beam



This novel product provides high precision, 50nm optical resolution with simultaneous topography and without deconvolution. 


  • Unprecedented error-free profiling of divergent sources with no detector saturation or beam attenuation. 


  • No non-uniformities or astigmatisms in profiling active or passive sources such as VCSELs, AWGs, Ultrasmall Mode Field Diameter Lensed Fibers etc.
  • Seamless complex beam structures 3D profiles from the near-field to the far-field with overlapping fields of view.




Ideal systems for this application:





  An optical fiber vertically mounted on MultiView 2000TM SPM head integrated with an upright optical microscope 
Wednesday, 20 February 2013 09:00

TFT in Liquid Crystal Image

Thin Film Transistor in Liquid Crystal Display

50 x 50 micron AFM Topgraphy   Simultaneously produced NSOM image

These images was produced using the MultiView 1000™ Microscope.

For more details, see the application note on TFT Displays Click here to download (489kB)

Wednesday, 20 February 2013 08:47

AFM, NSOM and Capicatance SRAM Image

AFM, NSOM and Capacitance Imaging

The first simultaneous NSOM/Capacitance ever to be produced.

10x10 micron AFM Topgraphy    NSOM Image of the same region

Only Nanonics Double Wire Electrodes can produce simultaneous NSOM/Capacitance measurements

These images were obtained by the MultiView 1000™
Simultaneous Capacitance Image of the same region
Wednesday, 20 February 2013 08:16

High Resolution NSOM Imaging in Reflection mode







A) Topographic AFM image of a Photonics Band Gap (PBG) structure, imaged with a 150nm AFM/NSOM cantilevered probe. 

B) Online correlated NSOM image of the PBG structure at (A). Imaged with the same probe in reflection mode at a 532nm laser wavelength.

C) NSOM line profile shows a lateral resolution of 100nm in reflection mode.
  • Nanonics unique, spatially friendly glass based probes allow for free optical axis from the top for NSOM imaging in reflection mode. Unlike other NSOM techniques, the Nanonics approach exclusively integrates  all MultiView SPM series with all types of optical microscopy including upright reflection microscopes, without obscuring the  optical axis from above. 
  • AFM and NSOM images are simultaneity acquired with the same probe to obtain fully correlated topographic and NSOM data without any need to change the probe.
  • For both feedback mechanisms of beam bounce and tuning fork, AFM/NSOM imaging is performed in normal force mode for the ultimate in sensitivity.
  • Nanonics' unique reflection NSOM mode is the standard for imaging opaque samples of photonic Si structures and microelectronics. All are easily characterized in reflection mode of an upright microscope without the need for complicated geometries.   
  • As demonstrated above, Nanonics provides the ultimate NSOM resolution in reflection mode of less than 100nm.



Ideal systems for this application: 


1. MultiView 1000 
2. MultiView 2000

3. MultiView 4000

4. CryoView 2000



Tuesday, 19 February 2013 12:13

PEO Spherulite Imaging

15 x 15 micron AFM image showing nucleus and lamellar
  Transmission NSOM image
Polarization shows the radial
dependence of the birefringence
Simultaneously obtained Confocal image of the same region. The highlighted area is the 15x15micron region imaged above.
Nanonics systems can perform simultaneous NSOM and Confocal microscopy the highest quality available today.

The Nanonics MultiView 1000™ is designed around  the 3D Flatscan™ which has a completely free optical axis from above and below the sample. Because Nanonics uses cantilevered optical fiber probes the microscope objective is not blocked by the probe.

This unique technology allows the MultiView 1000™ to be integrated into the Nanonics Dual Microscope which can simultaneously produce conventional confocal microscopy images along side transmission NSOM images

Tuesday, 19 February 2013 12:05

High Resolution NSOM Imaging of Au Grid

 A) AFM image of an Au grid glass surface obtained with an AFM/NSOM probe.                                     B) NSOM image obtained in transmission mode fully correlated with A.



Upper Graph: Shows the height line profile of image A. Notice the high resolution of the AFM image despite its being obtained with an NSOM probe.

Bottom Graph: Shows the NSOM line profile of image B. The cursors show a high lateral resolution of 50nm.

Tuesday, 19 February 2013 11:40

Murine Stem Cell Imageing





AFM and NSOM Flourescence of Murine Stem Cells



typical Z height approx. 18 microns











AFM and NSOM Transmission of Murine Stem Cells

  typical Z height approx. 18 microns




  The only difference between these images and the images above is the wavelength of the laser.
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