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Piezo Force Microscopy Imaging

Piezo Force Microscopy Imaging (PFM) with Nanonics MultiViewTM systems

  • Piezo Force Imaging of Periodically Poled Potassium Titanyl Phosphate PPKTP
  • Contact resonance PFM has been used for imaging of Topographic, Phase and Amplitudes signals.
     

5x5 microns AFM_Height Image of PPKTP crystal

Correlated PFM_Phase image

Correlated PFM_Amplitudeimage

     

AFM_Height 3D Presentation

PFM_phase 3D Presentation

PFM_Amplitude3D Presentation

     
 

Height and PFM_phase 3D Collage Presentation

Height and PFM_Amplitude 3D Collage Presentation

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Transistor NSOM Imaging

Transistor NSOM Imaging
   
AFM topographic image of semiconductor transistor     NSOM Reflection mode imaging of transistor at left  
 
 
 
 

  3D  Height Presentation  

 3D NSOM Presentation

 

• All MultiView systems allow for online AFM/NSOM imaging of opaque samples in Reflection mode

• Transparent fiber probe allows for free optical axis from top for Reflection mode imaging with true confocal optical microscope

3D AFM/NSOM collage image shows full topographic and optical imaging correlation  
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Polymer Blend

Polymer Blend
     
   AFM height image of Polymer Blend  AFM phase image of Polymer Blend  
     
AFM 3D presentation of Polymer Blend      
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Polymer Surface Imaging

Nickel incorporated in polymer matrix (see below for notes)

     
4.5 x 4.5 micron AFM Image z-range: 20nm  

3D image

 
   
     
1.5 x 1.5 micron AFM Image z-range: 12nm  

3D image

 
 
   
     
0.55 x 0.55 micron AFM Image z-range: 7nm  

 3D image


Imaging conditions:

  • Nanonics MultiView 400 system with a Ultrasharp probe in air 
  • 10 x 10 micron Flat Scanner, z-range: 2 micron 
  • Intermittent Contact mode imaging

In the 4.5 x 4.5 micron image, it can be clearly seen, that the polymer surface is very flat, but it consists of two distinct phases. There are islands which are 5 – 8 nm higher than the lower parts.

The same features are visible in the 1.5 x 1.5 micron image. In addition a granular structure of both the islands and the lower surface is visible in this image. This granules can have a connection to the incorporated Nickel, but it is also possible, that this granules are connected to the way the polymer film was fabricated.

The 0.55 x 0.55 micron image shows again the granular structure of both the islands and the lower surface. The granules are 20 – 50 nm in diameter and 0.5 – 2 nm high.There seems to be no difference in granularity between the islands and the lower polymer surface.

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Molecular Pentacene Imaging

 
 


 

                     2.5 microns x 2.5 microns

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Composite Polymer Imaging

 
     
5 x 5 micron AFM Topgraphy 
 

NSOM image of the same region 

     
3D Image    
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20 micron PMMA Microspheres Imaging

 

     
40 x 40 micron Topgraphy 
 
  3D image

Only Nanonics is able to produce AFM images with such a large z scan range.

 


The large 70 micron z scanning range of theNanonics 3D FlatScan Scanning System and the up to 500 micron tip length of the cantilevered optical fiber Nanonics Deep Trench AFM probe allows even larger topographic alteration to be readily monitored. 

The image was obtained with normal force feedback in the intermittant contact mode using the MultiView 400™.

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Block Co-polymer Imaging

 
 
 
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SRAM Topographic Image

 
SRAM
AFM, Thermal and Resistance Imaging
  
     
25x25 micron Thermal Image   AFM Image of the same region obtained in theIntermittent contact mode 
     

Only Nanonics Thermal Probes are capable of thermal imaging in the intermittent contact mode.

 
These images were obtained by the
MultiView 400™
 
 
Simultaneous Resistivity Image of the same region

Nanonics Thermal Probes have a thermal response time under 20us, thermal resolution under 10 millidegrees and nanometric spacial resolution.

In the Dual Wire Thermoresistive probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography with thermal conductivity or temperature.

 
 
SEM of Dual-Wire thermoresistive probe showing fused junction
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