AFM Image of Tip

Standard Silicon Tip 
Imaged by an Optical Fiber AFM Probe

   
 
2D AFM image of the tip area approximately 15µm x 15µm
     
3D Topographic Image of standard Silicon tip measured by AFM in the intermittent contact mode of operation  
 
These images were produced by the Nanonics MultiView 1000™ with an optical fiber probe in the intermittent contact mode. 

Only the Nanonics optical fiber AFM probes have high enough aspect ratios (10:1) and are narrow enough to image the structure of a standard Silicon Probe.
 
 
Cantilevered AFM Probe: note that the angle of the cantilever enables viewing the sample underneath the AFM tip
 
 
Sketch of  AFM Probe