Kelvin Probe Imaging of Au/Cr

 

 

 
   
AFM Height image of FIB etched gold on Chromium sample  and line profile respectively (below)    Kelvin Probe image shows contact potential difference of Au/Cr structure.  

 

 

   
 Height  KPM

 

   Height Profile
   CPD Profile

Performed with Nanonics unique ultrastable Nano-wire glass insulated electrical probe.

 

  • Ultrastable solid wire electrical probes q Ultra-Sensitive Tuning Fork Normal Force feedback
  • Geometrical friendly for online multiprobe all under active AFM feedback.
  • Low contact resistance and full insulation with glass upto the probe tip for high electro-potential resolution
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging
  • High cantilever design that minimizes cantilever electrical interference
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