Multiview 1500

Entry-level AFM with Optical Upgrade Capability


Scanning Probe Microscopy PRice


The award winning MultiView 1500TM is an entry-level system that fully integrates all forms of scanning probe microscopy (SPM) with conventional optical microscopy.  The MultiView 1500 system provides a cost-effective SPM solution complete with advanced SPM features.  The design of the MultiView 1500 emphasizes ease-of-use so that customers with any technical background can quickly make SPM measurements.  This system can also be easily upgraded to more sophisticated measurements such as NSOM and AFM-Raman.


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Key Features


Unprecedented flexibility and performance

Ease of use designed for quick setup with any background.  Compatible with NanoToolKit of probes including all third party silicon probes.  Easily upgradable to perform sophisticated measurements including AFM-Raman and NSOM

Standard packages include magnetic force microscopy (MFM) and electrostatic force microscopy (EFM); more advanced modes including kelvin force microscopy and scanning capacitance microscopy available in an upgrade


Complete optical access to scanning probe microscopy head

Unique geometry leaves the optical axis free both above and below the sample for integration with upright, inverted, and dual optical (both upright and inverted) microscopy configurations


Accomodates wide variety of probes

Nanonics provides a wide variety of probes that are compatible with the MultiView 1500 including glass, cantilevered probes, thermal probes, electrical and magnetic probes (electrochemical probes, coax probes, glass insulated wire probes), all third party silicon probes, chemical writing probes


Largest Commercially Available Z Scan Range

The large 85 micron x,y, and z-range of the Nanonics 3D Flatscan makes it ideal for optical sectioning in confocal imaging.  Used in this way, the MultiView 1500 integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system.


Overall, the MultiView 1500 is a robust and versatile SPM system that allows the user to zoom, with overlapping fields of view, from the lowest resolution of conventional far-field imaging to the higher resolution of confocal microscopy, and finally, to the ultimate resolution of AFM and NSOM.

NSOM Integration


All NSOM modes Including True Reflection mode NSOM

In true reflection mode,  light is introduced via the NSOM probe, and then collected by a detector above the probe as shown in the schematic on right.  True Reflection mode NSOM is possible on the MultiView 1500 due to the use of transparent, cantilever probes and separation of the excitation and collection paths.   

For a more detailed explanation of all the different modes of NSOM, including transmission, reflection, collection, and illumination modes, please see here


Cantilevered probes for the best NSOM performance

A whole suite of probes for all your NSOM applications compatible with the Multiview 1500 system, featuring:

Glass cantilevered normal force probes :  These types of probes operate as standard robust AFM probes for easy, high-quality imaging of all samples.  Additionally, the optical transparency of these probes provides an unobstructed optical view of the sample from above and below

Efficient Apertureless NSOM probes :  Fiber probes with metallic nanoparticles in tip and straight probes also available for shear force feedback measurements 


Any optical configuration

This enables total flexibility in your NSOM setup, as the MultiView 1500 can be integrated with any optical microscope.  Additionally, total optical access to sample and probe position from above is possible since the cantilever probe/scanner assembly does not obscure access

Back to NSOM Solutions page

Raman Integration


Effortless AFM and Raman integration

This MV1500 design results in a natural and straightforward Raman path for integration without the need for tilting or bending the Raman path to accomodate the scanning probe microscope. Both reflection Raman and transmission Raman are standard on the MV 1500.


Optically transparent probes for best Raman quality  

Nanonics is the pioneering manufacturer of bent, glass, optically transparent probes with no obstruction of the optical axis and the sample surface, which are provided exclusively to Nanonics customers.


Advanced scanning probe microscopy modes available with simultaneous Raman measurement

Advanced thermal, electrical, and magnetic SPM modes are available on the MV 1500 including MFM and EFM. These measurements can be done on their own, or in conjunction with simultaneous Raman imaging to obtain excellent correlation between the functional imaging mode and chemical Raman information.


Autofocus for superior Raman resolution

The MV 1500 provides autofocusing onto the sample at every pixel point. Thus for rough samples, tilted samples, or samples with unusual Z variation, the Multiview 1500 provides the best Raman resolution with the sample in focus at every point a Raman spectrum is collected


Designed for optical integration

The MV 1500 offers unhindered access to the sample and probe both from above and below. Furthermore, the MV 1500 can be combined with any microscope configuration including an upright, inverted, or dual microscope (combined upright and inverted) where the same scanning probe microscope head is used for either microscope configuration.

Back to Raman Solutions page


Online Integrations


MultiView 1500TM Online Integrations




 Optical Microscopy

 Raman Spectroscopy




Environmental Chambers 


Optical Integration

The first SPM that can be integrated into upright, inverted & even 4 Pi optical microscopes which are the most advanced form of optical microscopy

  MultiView 1500TM on a Standard Upright Microscope     MultiView 1500TM on a 4Pi Dual Microscope    MultiView 1500TM on a Standard Inverted Microscope


Raman Integration


   MultiView 1500TM directly mounted on Renishaw Invia Raman Spectrometer.


On-line & Simultaneous AFM and Raman:

  • Raman intensities for the first time can be effectively compared with AFM based autofocus
  • Significant resolution improvements are achieved even without near-field techniques
  • Other on-line advantages
  • Surface enhanced techniques can be transparently applied



Complementary and transparent on-line operation of both SEM and AFM imaging techniques in one system allows for a synergism of operation for example rapid SEM placement of the SPM probe over a large field, verification of the integrity of the probe, on-line electrical measurement of nanostructures for on line carrier concentration and other nanocharacterization tasks as delineated in this presentation.


 MultiView 1500TM inside SEM

 Clode-up View

 Free optical axis inside SEM


Environmental Chamber

The Nanonics EnviroView 1500TM is built upon the unique technology of the Nanonics MultiView 1500TMmicroscope. Nanonics EnviroView 1500TM allows for controlled environmental of the NSOM or SPM system that has a completely free optical axis and can be integrated with all modes of optical microscopy

  • Precise humidity control
  • Unobstructed optical axis
  • Gas inlet port
  • Chemical Delivery by nanopipette
  • 10-6 Torr High Vacuum Chamber
  • Transparent integration with any optical microscope, including dual microscopes
  • Complete freedom of optical microscope nose piece rotation