Nanonics produces a variety of conductive cantilevered and straight probes for simultaneous AFM and conductive measurements:
Gold Coated Fiber Probes
Gold coated Nanonics glass AFM fiber tips can serve as excellent electrical probes for spreading resistance microscopy and AFM imaging, allowing electrical characteristics of a sample to be correlated with its surface topography. In addition, these probes are optically friendly for integration with AFM-Raman.
Specifications
|
PROBE MATERIAL |
Quartz |
|
COATING |
Au |
|
TIP DIAMETER |
greater than or equal to 50 nm |
|
TOTAL LENGTH |
5mm-5cm |
|
BEND ANGLE |
30°-90° |
|
FORCE CONSTANT |
20-40N/m |
|
RESONANCE FREQUENCY |
20-100 kHz for beam bounce feedback 32.4kHz for Tuning fork feedback
|
Single Wire Electrodes
Nanonics produces unique cantilevered single wire electrodes for conductive atomic force microscopy. The electrodes are metal noble wire sealed into glass and pulled to the nano metric apex.
Specifications
|
PIPETTE MATERIALS |
Borosilicate glass |
|
INNER ELECTRODE MATERIAL |
Pt, Ag, Au, other materials are available |
|
STARTING WIRE DIAMETER |
25nm or 50nm |
|
FORCE CONSTANT |
50-100 N/m |
|
RESONANCE FREQUENCY |
20-100 kHz for beam bounce feedback 32.4kHz for Tuning fork feedback |
In addition to the electrical measurements, the electrode can operate as an electrochemical and coaxial probe.
Coaxial Shielded Electrodes
Coaxial shielded probes are single wire probe with gold coating shield. This probe operates as a coaxial cable and can be used for characterization of the conductive properties.
Double Wire Electrodes
In the Double-Wire Electrode probe, two platinum wires are tapered inside a dual-channel nanopipette and kept electrically isolated. They can be used to perform electrical measurements on submicron-scale devices, such as resistance and capacitance modes. Because the probes use normal-force feedback to stay in contact with the surface, these electrical measurements can be correlated with the surface topography obtained through the simultaneous AFM imaging.
Specifications
|
PIPETTE MATERIALS |
Borosilicate glass |
|
ELECTRODE MATERIAL |
Pt |
|
TIP DIAMETER |
greater than or equal to 300nm |
|
STARTING WIRE DIAMETER |
25um |
|
FORCE CONSTANT |
50-100N/m |
|
RESONANCE FREQUENCY |
20-100 kHz for beam bounce feedback 32.4kHz for Tuning fork feedback
|
Key Features
1. Exposed Tip for Optical and Spectral Transparency
 |
 |
| Does not obscure optical axis from above and below for full integration and optical microscopes, Raman spectrometers, FTIR spectrometer and other optical modailities. | |
2. Multiprobe Capabilities
Cantlievered shape and exposed tip enable to bring the tips of two electircal probes in AFM feedback within nanometric distance one to another. The multiprobe system with electrical probes functions as electrical probe station.
