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Recent Newsletter

Ultra Sensitivity of Tuning Forks in Photon Force Imaging (PiFM)

-September 2019-

 

Recent Advance By Nanonics Customer: Jahng et al “Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor” [Sensors 2019, 19, 1530; doi:10.3390/s19071530]

Photon Force is an exciting way to perform NSOM imaging, from the UV to the mid-infrared.  The technique is generally known as PiFM.  Such photon force with a scanning probe microscope was pioneered by a Nanonics customer, Professor Aristide Dogariu of the University of Central Florida (CREOL) [Dana C. Kohlgraf-Owens, Sergey Sukhov, and Aristide Dogariu, “Mapping the mechanical action of light” PHYSICAL REVIEW A 84, 011807(R) (2011)].
 
Recently, Nanonics systems, both the Multivew 2000 single probe and Multiview 4000 multiple probe systems, have been used to show the exceptional capabilities of tuning fork SPM probes in the measurement and analysis of imaging in PiFM mode [Junghoon Jahng , Hyuksang Kwon and Eun Seong Lee, “Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor  Sensors 2019, 19, 1530; doi:10.3390/s19071530 ].  
 
Tuning forks have multiple eigen modes which allow different parameters of both the photon momentum and the feedback that is impossible using silicon probes and beam bounce feedback technology often used in SPM imaging. Read more...
 

 

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