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Integrated Microscopy
AFM/Raman of Si/SiO2 Grid
Antenna Probes
Antenna Probes
Nanonics Systems Can Use Any Probe
Antenna Probes
Large Z-Range Imaging of Razor Blade
AFM/Raman of Strained Si Transistor
AFM Raman of CNT Nanowire on Silicon
Thermal Imaging of Optical Fiber
Online AFM/Raman of an Si/SiO2 Grid
AFM/Thermal in Non-Contact Mode
FIB Etched Trench
SEM/AFM Integration
AFM, NSOM and Capicatance
Nano biological AFM NSOM solutions
Image of Standard Silicon AFM Tip
Second Harmonic Imaging and Non-Linear Microscopy
Depth Profiling of a Polymer Blend
Micro-electronic Device Structures
Photonic Band Gap Materials
AFM Raman Imaging




Unique Probes

 

Ultrastable High Sensitivity AFM Electrical Probes

  • Ultrastable solid wire electrical probes.
  • Low-contact resistance and full insulation with glass up to the probe tip for high electro-potential resolution.
  • Glass coating insulation can be overcoated with metal to emulate coax geometries for ultrahigh sensitivity electrical imaging.
  • High cantiliver design that minimizes cantilever electrical interference.

 



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