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Materials
Block Co-polymer Imaging
SRAM Topographic Image
20 micron PMMA Microspheres Imaging
Composite Polymer Imaging
Molecular Pentacene Imaging
Polymer Surface Imaging
Polymer Quantum Dots - Raman Imaging
Polymer Blend
Piezo Force Microscopy Imaging
Quantum Laser Thermal Image
TFT
AFM/NSOM and Capacitance
SRAM electrical image
FIB Trench
Silicon NanoIndentation
NSOM Reflection of SRAM
Imaging of PN Junction
Silicon Semiconductor image
Stressed Silicon image
The Nanonics AFM/SPM/NSOM 2000 Confocal Microscope TM
Nano Elasticity
Piezo Force Microscopy Imaging of KTP Crystal
Transistor NSOM Imaging
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AFM topographic image of semiconductor transistor     NSOM Reflection mode imaging of transistor at left 
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  3D  Height Presentation  

 3D NSOM Presentation

 transistor_collage_1142

• All MultiView systems allow for online AFM/NSOM imaging of opaque samples in Reflection mode

• Transparent fiber probe allows for free optical axis from top for Reflection mode imaging with true confocal optical microscope

3D AFM/NSOM collage image shows full topographic and optical imaging correlation  




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