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Nanoindentation
Raman-AFM of MEMs Device
Stressed Silicon
Raman Imaging of Germanium Quantum Dots
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
AFM with On-Line Raman of Strained Silicon
AFM, NSOM and Capacitance
NanoIndentation and Raman Characterization
Online AFM/Raman of an Si/SiO2 Grid
AFM/Raman of Si/SiO2 Grid
Resistance Imaging of PN Junction
Nanoindentation on Silicon
FIB Etched Trench
Thermal imaging of SRAM
TFT in Liquid Crystal Display
Silicon Semiconductor
Thermal Imaging of V Grooved Quantum Laser
Electrical Imaging of SRAM
Reflection NSOM of SRAM
Topography of SRAM
Topography of SRAM

 

AFM and Reflection NSOM of SRAM

4 X 4 micron AFM image of SRAM showing a topographic relief of the surface The simultaneous NSOM image obtained in reflection mode shows the structure underneath the silicon layer

  device structure

 

These Images were produced using the The MultiView 1000™.

This is the only system available today which can produce reflection NSOM in the intermittent contact mode.


 
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