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Electrical and Thermal SPM
Graphene Transistor AFM_EFM Imaging
Scanning Thermal Microscopy of GaN NanoWires
Scanning Photocurrent in Graphene Transistors
Nano Optical and Thermal SPM
MultiProbe AFM_Thermal_Electrical and NSOM Imaging
Kelvin Probe Imaging of Graphene
Kelvin Probe Imaging of Gold Silicon
KPM Imaging of Gold Electrode on Doped Silicon
Kelvin Probe Imaging of Au/Cr
Schottky Diode I-V Characterization
Current Mapping of Au Electrodes on Silicon
Spreading Resistance Electrical Imaging of Au_Si
Au etched groove on silicon
Thermo Resistance Imaging of Chip
Thermo Conductivity Imaging of Semiconductor Chip

 

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AFM height image of semiconductor chip  high resolution thermo-conductivity imaging the semiconductor chip. 

AFM Thermoresistive Nanonics Probe

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In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity



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