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Semiconductors
Nanoindentation
Raman-AFM of MEMs Device
Stressed Silicon
Raman Imaging of Germanium Quantum Dots
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
AFM with On-Line Raman of Strained Silicon
AFM, NSOM and Capacitance
NanoIndentation and Raman Characterization
Online AFM/Raman of an Si/SiO2 Grid
AFM/Raman of Si/SiO2 Grid
FIB Etched Trench
Resistance Imaging of PN Junction
Nanoindentation on Silicon
Thermal imaging of SRAM
TFT in Liquid Crystal Display
Silicon Semiconductor
Electrical Imaging of SRAM
Topography of SRAM
Reflection NSOM of SRAM
Topography of SRAM




Thermal Imaging of V Grooved Quantum Laser

V Grooved Quantum Wire Laser

4x4 micron Collection NSOM image taken during operation Thermal Image of the same region

The collection mode NSOM image clearly reveals the V-shaped evanescent field on either side of the Quantum Well Laser. Note that areas with high light intensity are not identical with areas of high thermal intensity. This information can only be uncovered by simultaneous imaging.

These Images were produced using the The MultiView 1000™ and Nanonics Thermal Probes.

Only Nanonics Thermal Probes have a thermal response time under 20us thermal resolution under 10 millidegrees and nanometric spacial resolution.

In the Dual Wire Thermoresistive probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography with thermal conductivity or temperature.   
SEM of Dual-Wire thermoresistive probe showing fused junction 



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