The combined Nanonics MultiViewTM Raman Microscope systems are the first to allow on-line AFM (Atomic Force Microscopy) and other Scanning Probe Microscopies (SPM)with Raman spectroscopy.  Compromise neither the SPM or  Raman microscopies in this synergistic combination of technologies

>Combined on-line pixel by pixel surface topography and Raman chemical characterization. >No Raman background transparent cantilevered patented glass fiber probes. >On-line AFM autofocus allowing ultrahigh resolution far-field Raman imaging (150 nm guaranteed). >Tip Enhanced Raman Spectroscopy (TERS) guaranteed AFM and Raman spectroscopy of MEMS devices. High resolution of local silicon stress in MEMS devices. >Multiple probe option of Raman interfered probe (tip enhancement, nano indentation, force regulation,..) and high resolution AFM probe.

SPM - Raman Systems

MultiView 1000TM >Suitable for standard on-line AFM and Raman characterization > Ideal for biological imaging >Imaging in aqueous environments with a unique liquid cell that has a free axis from above and below >100 micron Z range >Beam Bounce Feedback >ALL NSOM modes	MultiView 2000TM >Independent tip and sample movement >Ideal for Tip Enhanced Raman Spectroscopy (TERS) >Imaging in aqueous environments with a unique liquid cell that has a free axis from above and below >100 micron Z range >Tuning Fork feedback >ALL NSOM modes

	MultiView 4000TM >Independent movement of sample and up to four probes >Unique thermal probes for multiple probe measurements >Ideal for combined AFM -Raman with electrical measurements
	>Multiple probe near-field optical (NSOM or SNOM) measurements with Raman >Multiple probe nanochemical writing on a variety of structures with a variety of gaseous or liquid or solid inks with Fountain Pen NanochemistryTM

AFM-Raman Integration

The hardware and the software of the Nanonics NSOM/AFM MultiView systems are transparently integrated with a Renishaw Raman Microscope . There are two major factors that enable the Nanonics AFM system to be successfully integrated with Raman spectroscopy:

1) Nanonics' patented, transparent, glass cantilevered probes

2) Nanonics' flat and ultrathin scanning platform that makes use of four piezo drivers. These cylindrical piezos are placed in a quadrant fashion around the sacnner

Nanonics' Unique Probes

Probe geometry: Nanonics systems use patented cantilevered optical fiber probes. The cantilevered optical fiber is held between the objective lens and the sample without obstructing any aspect of the far-field conventional upright or inverted microscope. The tip of the fiber is exposed, allowing direct viewing of the scanned region. The probe geometry and dimensions can be easily customised for different applications

Advantage over standard silicon probes: •These probes overcome the problem of obscuring the far filed view of the upright microscope. Standard silicon tips have a flat cantilever which blocks the field of view from an upright microscope •Does not generate any background Raman signal unlike regular silicon probe. •Easily customized to different samples and applications Taking advantage of the points above, There are NO LIMITATIONS on Samples, both opaque and transparent samples can be used with out any interference with the Raman data

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3D FlatScanner Platform

Flat Scanner: Nanonics SPM platforms are optically and micro-Raman friendly. The platforms make use of four cylindrical piezos placed around the platform in a quadrant fashion (as shown in Fig.4). As opposed to upright-architectured piezos used in conventional SPM (see fig.?) platforms, the Nanonics scanning stage is very thin (7mm) allowing the head to be integrated into all upright optical microscopes. The open optical axis allows for free viewing of >20mm.The platform also allows for rough scanning whereby the sample under inspection can be rapidly moved via inertial motion mechanism.

 

Advantages of the flat scanner: •Free optical axis for upright and inverted optical microscope view. •Scanning small and large topography due to the flexible scan ranges from nanometer scale to approximately 100 microns in XY and up to 70 microns in Z. •Sample fine positioning through inertial motion in increments of 1 micron up to 2-3mm.

Conventional Raman Mapping 

There is a serious drawback to Raman Spectroscopy when studying non-smooth surfaces. As with all lens-based microscopy techniques, Raman suffers from the problem of out-of–focus light. When a sample is scanned conventionally under the illuminating beam of a Raman microscope, the uneven sample surface will scan in and out of the focal plane. As a result the resolution of the Raman mapping is limited by the large area of the unfocussed beam on the sample. In addition, the point spread function is significantly broader where there are contributions from the out-of-focus light.

As a result the Raman spectra of non-flat surfaces can be very misleading, and tend to misrepresent the true information that could be gained by using Raman.

Raman Mapping with Z-Control

The problem of out-of focus light can be solved by using a Z-feedback mechanism. With this feedback in place the surface of the sample can be kept in the focal plane throughout the scan.   All the Nanonics MulitView AFM platforms have completely free optical axis. This makes them the ideal add on to any Raman system to provide the Z-control necessary for true high resolution Raman mapping.