The following AFM images represent an array of silver particles patented on a glass slide and viewed with Nanonics' MultiView 400TM microscope head in tapping mode with sample movement. These super resolution images were accomplished using a specialized Nanonics' AFM cantilevered probe with a tip diameter of less than 10nm.   
  
X dimension represents width.  The curve outlined indicates the width of a single silver particle.
 Z dimension represents topography.  The arrow indicates the height of one silver particle.
 

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