| Localized Schottky Diode I-V characterization: 20nm gold layer on 5nm Ti over Silicon substrate (Natural Oxide) |
High sensitivity AFM Pt nanowires probes are used with the Nanonics MultiProbe system for electrical nano-charactarization of the inspected sample. One probe is used as a voltage source and the second probe is used to measure the current. The ability of these probes to provide both electrical and topographical information creates a special platform of accurate alignment at nanometric features such as nanotubes, nanoparticles and other molecular devices.
The electrical measurements and analysis are fully controlled through the SPM system. Hence, a comprehensive analysis of I-V nanometric spectroscopy correlated with topographical maps are provides.
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