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Graphene Transistor AFM_EFM Imaging
Thermo Conductivity Imaging of Semiconductor Chip
Scanning Photocurrent in Graphene Transistors
Nano Optical and Thermal SPM
MultiProbe AFM_Thermal_Electrical and NSOM Imaging
Kelvin Probe Imaging of Graphene
Kelvin Probe Imaging of Gold Silicon
KPM Imaging of Gold Electrode on Doped Silicon
Kelvin Probe Imaging of Au/Cr
Schottky Diode I-V Characterization
Current Mapping of Au Electrodes on Silicon
Spreading Resistance Electrical Imaging of Au_Si
Au etched groove on silicon
Thermo Resistance Imaging of Chip




Scanning Thermal Microscopy of GaN NanoWires

 

sthm_nanowires_1874 
Scanning Thermal Microscopy (SThM) for quantitatively investigating the heat dissipation characteristics in substrate-supported andsuspended (with asymmetric type of contacts) current-carrying GaN nanowires with diameters of4060 nm, where the phonon confinement is expected to play an important role in thermal transport.

(a) Schematics of the SThM experiments; (b) ac and (c) dc SThM images with the inset to (b) showing the measured Vth (solid circles) as a function of Vrms and the parabolic fitting (dashed line); (d) SThM images showing the "double-line"-like structure and (e) the corresponding profile across the nanowire; (f) SThM image obtained in vacuum (106 Torr); (g) profiles of ambient and vacuum SThM images taken perpendicular to the nanowire.

SOUDI ET AL., ACS NANO VOL. 5, NO. 1 (2011)

 

AFM Thermoresistive Nanonics Probe

 theromoresistance_probe_745_02

In the Dual Wire Thermo-Resistance probe, two platinum wires are stretched through the nanopipette and fused together at their tips. This fused junction has a resistance that is temperature-dependent. This unique tip allows simultaneous measurement of surface topography and thermal conductivity 

 



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