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Semiconductors
Nanoindentation
Raman-AFM of MEMs Device
Stressed Silicon
Raman Imaging of Germanium Quantum Dots
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
AFM with On-Line Raman of Strained Silicon
AFM, NSOM and Capacitance
NanoIndentation and Raman Characterization
Online AFM/Raman of an Si/SiO2 Grid
AFM/Raman of Si/SiO2 Grid
FIB Etched Trench
Resistance Imaging of PN Junction
Nanoindentation on Silicon
Thermal imaging of SRAM
TFT in Liquid Crystal Display
Silicon Semiconductor
Thermal Imaging of V Grooved Quantum Laser
Electrical Imaging of SRAM
Topography of SRAM
Topography of SRAM




Reflection NSOM of SRAM

AFM and Reflection NSOM of SRAM

4 X 4 micron AFM image of SRAM showing a topographic relief of the surface The simultaneous NSOM image obtained in reflection mode shows the structure underneath the silicon layer


These Images were produced using the The MultiView 1000™ . This is the only system available today which can produce reflection NSOM in the intermittent contact mode.



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