Raman Imaging of Uneven Surfaces with and without AFM Auto-Focus

The Intensity of a Raman band in this case the vibrational mode of diamond at 1334cm-1 in a diamond film is entirely different with and without AFM feedback.

Only Nanonics combined Raman and AFM system can provide the rigorous Z Feedback necessary for Comparing Raman Intensities of Uneven Surfaces.
 

Raman Image Map With AFM Auto-Focus		The Same Map Without AFM Auto-Focus

For this measurement the cantilevered glass AFM probe  was brought into contact with the sample using the MultiView 400™ SPM system. The Nanonics MultiView 400™ system can be directly integrated into the Renishaw RM Series Raman Microscope. These microscopes employ the upright microscope configuration, and the Nanonics MultiView 400™ has a free optical axis which allows it to be readily placed on the sample stage of such a microscope (see picture). The Nanonics patented cantilevered optical fibers are held between the microscope lens and the sample without obstructing any aspect of the far-field optics. The tip in these fibers is exposed and is illuminated by the lens of the microscope, allowing the user to view the exact region where the SPM and Raman information is being collected.

The MultiView 400™ Integrated with a standard Raman Microscope

Only Nanonics combined Raman and AFM system allows Raman spectra to be taken while an AFM tip is in contact with the sample.