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Semiconductors
Nanoindentation
Online AFM/Raman of an Si/SiO2 Grid
NanoIndentation and Raman Characterization
AFM, NSOM and Capacitance
AFM with On-Line Raman of Strained Silicon
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
Stressed Silicon
Raman-AFM of MEMs Device
AFM/Raman of Si/SiO2 Grid
Resistance Imaging of PN Junction
Nanoindentation on Silicon
FIB Etched Trench
Thermal imaging of SRAM
TFT in Liquid Crystal Display
Silicon Semiconductor
Thermal Imaging of V Grooved Quantum Laser
Electrical Imaging of SRAM
Topography of SRAM
Reflection NSOM of SRAM
Topography of SRAM




Raman Imaging of Germanium Quantum Dots

A Raman image formed by plotting the ratio of the peak at 408 cm-1 to the valley at 420 cm-1. Because of the on-line AFM there is a reduction in the point spread function (PSF) with no contribution of out-of-focus light from above the sample surface. In addition, the stage allows for subpixel movements and this together with the reduction in the PSF results in resolutions of <100 nm, which is half the width of the feature shown in this line scan. 



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