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Depth Profiling of a Polymer Blend (Polybutyl methacrylate 69%)/PDMS/Chloroform
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Often a preferred way to view depth profiling is to image the edge of a film. For hard films like semiconductors such edges can be produced with little surface roughness. With polymer films however it is difficult to produce an edge without significant surface roughness and this does not permit true Raman intensity comparisons when imaging an edge. However, with an on-line AFM this problem is now resolved. |
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Topographic image of the edge of a polymer blend film as shown by the blue arrows with the Raman image superimposed in one region. The Raman map was produced for the 495 cm-1 band of PDMS. Note as shown in the 3D topographic image on the left the height variation is 8.5 microns which would have precluded Raman intensity comparison without on-line AFM. |
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