AFM topographic image of nanometric CdSe quantum dots  dispersed on  H2 treated gold substrate

•  Quantum dots with dimensions of few nanometers are easily imaged with
  
  Nanonics SPM MultiView series due to the sub-Angstrom accuracy of the XYZ 3D
  
  FlatScanTM sample stage.
  
  

•    The ultra-sensitive phase feedback of the Nanonics Integra Controller  with its
  
  large dynamic range and its low Z noise provide a clear image of nanometric
  
  features inspite of a relatively large topographic background.   

Ideal systems for this application:

• MultiView 1000
• MultiView 2000
• MultiView 4000
• CryoView 2000

NSOM SNOM sSNOM		AFM, Raman, TERS		Photonics, Plasmonics		BioSPM
MultiProbe SPM		Materials		AFM Images		Nano Lithography
Electrical and Thermal SPM