The force exerted by the scanning probe on the sample surface can sometimes damage the surface and reduce the resolution of the scan. The forces on the sample surface can be reduced by using the non-contact mode in which the contact between probe and sample is only temporary.
 

• Scanning of Highly Sensitive surface structures.
• Lower forces on sample surfaces
• Increased resolution in topographical measurements
• Reduced damping of the dynamic system

The force can be further reduced by using the Q-control module which increases the effective Q factor of the the dynamic system.

Various applications show that many highly sensitive surface structures, in particular ultrathin organic layers or biological samples, can only be non-destructively imaged and characterized by using such an active feedback circuit. Furthermore, Q-Control can often improve the maximum achievable resolution in topographical measurements and can increase the overall sensitivity for magnetic or electrostatic fields.