The award winning MultiView 1500TM is an entry-level system that fully integrates all forms of scanning probe microscopy (SPM) with conventional optical microscopy. The MultiView 1500 system provides a cost-effective SPM solution complete with advanced SPM features. The design of the MultiView 1500 emphasizes ease-of-use so that customers with any technical background can quickly make SPM measurements. This system can also be easily upgraded to more sophisticated measurements such as NSOM and AFM-Raman. Overall, the MultiView 1500 is a robust and versatile SPM system that allows the user to zoom, with overlapping fields of view, from the lowest resolution of conventional far-field imaging to the higher resolution of confocal microscopy, and finally, to the ultimate resolution of AFM and NSOM.

MultiView1500

Key Features

Unprecedented Flexibility & Performance

probe 478Ease of use designed for quick setup with any background. Compatible with NanoToolKit of probes including all third party silicon probes. Easily upgradable to perform sophisticated measurements including AFM-Raman and NSOM Standard packages include magnetic force microscopy (MFM) and electrostatic force microscopy (EFM); more advanced modes including kelvin force microscopy and scanning capacitance microscopy available in an upgrade.

Accommodates Wide Variety of Probes

probes resize productspageNanonics provides a wide variety of probes that are compatible with the MultiView 1500 including glass, cantilevered probes, thermal probes, electrical and magnetic probes (electrochemical probes, coax probes, glass insulated wire probes), all third party silicon probes, chemical writing probes.

Largest Commercially Available Z Scan Range

MV1000 c small 173The large 85 micron x,y, and z-range of the Nanonics 3D Flatscan makes it ideal for optical sectioning in confocal imaging. Used in this way, the MultiView 1500 integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system.

Optical Integration: Complete Optical Access to Scanning Probe Microscopy Head

mv1000 dual0 194

Unique geometry leaves the optical axis free both above and below the sample for integration with upright, inverted, and dual optical (both upright and inverted) microscopy configurations. The first SPM that can be integrated into upright, inverted & even 4 Pi optical microscopes which are the most advanced form of optical microscopy.

mv1000 upright 292mv1000 inverted 386 01mv1000 dualcloseupjpg 257

Seen above: MultiView 1500 on a (L to R) standard upright microscope, on a 4Pi dual microscope, on a standard inverted microscope)

NSOM

All Modes of NSOM - Including True Reflection NSOM

truereflectionIn true reflection mode, light is introduced via the NSOM probe, and then collected by a detector above the probe as shown in the schematic on right. True Reflection mode NSOM is possible on the MultiView 1500 due to the use of transparent, cantilever probes and separation of the excitation and collection paths.

You may read more detailed explanations of all the different modes of NSOM: including transmission, reflection, collection, and illumination

Cantilevered Probes for the Best NSOM Performance

A whole suite of probes for all your NSOM applications compatible with the Multiview 1500 system, featuring:

MV1000 dropofwater 233Glass cantilevered normal force probes: These types of probes operate as standard robust AFM probes for easy, high-quality imaging of all samples. Additionally, the optical transparency of these probes provides an unobstructed optical view of the sample from above and below.

Efficient Apertureless NSOM probes: Fiber probes with metallic nanoparticles in tip and straight probes also available for shear force feedback measurements

Any Optical Configuration

mv1000 dual0 194Enjoy total flexibility in your NSOM setup, as the MultiView 1500 can be integrated with any optical microscope. Additionally, total optical access to sample and probe position from above is possible since the cantilever probe/scanner assembly does not obscure access

Raman

Effortless AFM and Raman integration

mv1000 invia 179 01This MV1500 design results in a natural and straightforward Raman path for integration without the need for tilting or bending the Raman path to accomodate the scanning probe microscope. Both reflection Raman and transmission Raman are standard on the MV 1500.

Advanced SPM Modes Available with Simultaneous Raman Measurement

Advanced thermal, electrical, and magnetic SPM modes are available on the MV 1500 including MFM and EFM. These measurements can be done on their own, or in conjunction with simultaneous Raman imaging to obtain excellent correlation between the functional imaging mode and chemical Raman information.

Designed for Optical Integration

The MV 1500 offers unhindered access to the sample and probe both from above and below. Furthermore, the MV 1500 can be combined with any microscope configuration including an upright, inverted, or dual microscope (combined upright and inverted) where the same scanning probe microscope head is used for either microscope configuration.

On-line & Simultaneous AFM and Raman 

mv1000 renishaw 616Raman intensities for the first time can be effectively compared with AFM based autofocus.

Significant resolution improvements are achieved even without near-field techniques.

Other on-line advantages.

Surface enhanced techniques can be transparently applied.

Above: MultiView 1500 directly mounted on Renishaw Invia Raman Spectrometer.

Optically Transparent Probes for Best Raman Quality

MEM1RSNanonics is the pioneering manufacturer of bent, glass, optically transparent probes with no obstruction of the optical axis and the sample surface, which are provided exclusively to Nanonics customers.

Autofocus for Superior Raman Resolution

autozfocusThe MV 1500 provides autofocusing onto the sample at every pixel point. Thus for rough samples, tilted samples, or samples with unusual Z variation, the Multiview 1500 provides the best Raman resolution with the sample in focus at every point a Raman spectrum is collected.

Contact a Nanonics Specialist to Discuss Your Specific Needs

We are happy to answer all questions and inquiries

SEM/FIB

Complementary & Transparent On-line Operation of SEM & AFM

Complementary and transparent on-line operation of both SEM and AFM imaging techniques in one system allows for a synergism of operation for example rapid SEM placement of the SPM probe over a large field, verification of the integrity of the probe, on-line electrical measurement of nanostructures for on line carrier concentration and other nanocharacterization tasks as delineated in this presentation

semintegration1 457 01mv1000 sem 180 01semintegration 640

Seen above: MultiView 1500 (L to R) inside SEM, close-up view, free optical axis inside SEM

Environmental Chamber

Environmental Chamber

The Nanonics EnviroView 1500TM is built upon the unique technology of the Nanonics MultiView 1500TMmicroscope. Nanonics EnviroView 1500TM allows for controlled environmental of the NSOM or SPM system that has a completely free optical axis and can be integrated with all modes of optical microscopy.

  • Precise humidity control
  • Unobstructed optical axis
  • Gas inlet port
  • Chemical Delivery by nanopipette
  • 10-6 Torr High Vacuum Chamber
  • Transparent integration with any optical microscope, including dual microscopes
  • Complete freedom of optical microscope nose piece rotation

mv1000 environmental 181 01mv1000 environmentscheme 217

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