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Analysis microscopy emission field by microscope optical near-field scanning of probes fiber

A Nanonics Telecommunications Solution: Characterization of the Topography And Simultaneous Near-Field/Far-Field Light Distribution of a Micro Lensed Telecommunications Fiber

Defect Review in the Photonics Revolution: the Critical Role of Near-Field Optics in the Characterization of Waveguides, Optical Interconnects, Lasers, and Their Integrated Emulations

Fountain Pen Nanochemistry: Atomic Force Control of Chrome Etching

Imaging P-N Junctions by Scanning Near-Field Optical, Atomic Force and Electrical Contrast Microscopy

Investigating Material and Functional Properties of Static Random Access Memories Using Cantilevered Glass Multiple-Wire Force-Sensing Thermal Probes

Local detection of electromagnetic energy transport below the diffraction limit in metal nanoparticle plasmon waveguides STEFAN A. MAIER, et al. Nature Materials, Vol.2 No.4, p.229–232

Near-Field Optical Photomask Repair with a Femtosecond Laser

Near-field Scanning Optical, Atomic Force, Scanning Resistance, and UV Confocal Microscopy in the Failure Analysis of ULSIs Produced with the Most Advanced Sub-Quarter Micron Design Rules

Failure Analysis of Integrated Circuits Beyond the Diffraction Limit: Contact Mode Near-Field Scanning Optical Microscopy with Integrated Resistance, Capacitance, and UV Confocal Imaging

Near-Field Scanning Optical Microscopy Studies of V-Grooved Quantum Wire Lasers

Near-Infrared Contact Mode Collection Near-Field Optical and Normal Force Microscopy of Modulated Multiple Quantum Well Lasers

Nonperturbing observation of optical near field

Proprietary Production of Fiber Optics Elements for DWDM and Other Suppliers

Seeing the Unseen in DWDM Telecommunications Devices

Transparently combining SEM, TEM & FIBs with AFM/SPM & NSOM

Topographic profiling and refractive-index analysis by use of differential interference contrast with right-field intensity and atomic force imaging

What is the AFM / NSOM Difference?


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