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| |  | | A Nanonics Telecommunications Solution: Characterization of the Topography And Simultaneous Near-Field/Far-Field Light Distribution of a Micro Lensed Telecommunications Fiber |
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| |  | | Fountain Pen Nanochemistry: Atomic Force Control of Chrome Etching |
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 | | Imaging P-N Junctions by Scanning Near-Field Optical, Atomic Force and Electrical Contrast Microscopy |
| |  | | Investigating Material and Functional Properties of Static Random Access Memories Using Cantilevered Glass Multiple-Wire Force-Sensing Thermal Probes |
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 | | Local detection of electromagnetic energy transport below the diffraction limit in metal nanoparticle plasmon waveguides STEFAN A. MAIER, et al. Nature Materials, Vol.2 No.4, p.229–232 |
| |  | | Near-Field Optical Photomask Repair with a Femtosecond Laser |
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 | | Near-field Scanning Optical, Atomic Force, Scanning Resistance, and UV Confocal Microscopy in the Failure Analysis of ULSIs Produced with the Most Advanced Sub-Quarter Micron Design Rules |
| |  | | Failure Analysis of Integrated Circuits Beyond the Diffraction Limit: Contact Mode Near-Field Scanning Optical Microscopy with Integrated Resistance, Capacitance, and UV Confocal Imaging |
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 | | Near-Field Scanning Optical Microscopy Studies of V-Grooved Quantum Wire Lasers |
| |  | | Near-Infrared Contact Mode Collection Near-Field Optical and Normal Force Microscopy of Modulated Multiple Quantum Well Lasers |
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 | | Nonperturbing observation of optical near field |
| |  | | Proprietary Production of Fiber Optics Elements for DWDM and Other Suppliers |
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 | | Seeing the Unseen in DWDM Telecommunications Devices |
| |  | | Transparently combining SEM, TEM & FIBs with AFM/SPM & NSOM |
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 | | Topographic profiling and refractive-index analysis by use of differential interference contrast with right-field intensity and atomic force imaging |
| |  | | What is the AFM / NSOM Difference? |
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