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SpectraView 2500

 Integrating Scattering Techniques with Ultrasensitive SPM/AFM


A Breakthrough in Combining Complementary Scattering Techniques with Ultrasensitive AFM and SPM for NanoChemical Analysis





  • Colocalized IR, Raman, THz and AFM
  • Singular protocols for excitation in the IR with Raman and fluorescence detection in the visible
  • Image with photon force with pN force sensitivity
  • Patented cantilevered completely transparent probes
  • Highly localized scattering at the tip
  • Versatile configurations with advanced SPM modes of operation: Kelvin Probe chemical potential, electrical, thermal and photon force detection
  • Online variable magnetic fields
  • Applications in plasmonics of 2D materials, liquids, biology etc.





AFM (Left) and IR (right) images obtained with broadband IR illumination (1000-4000cm-1) at the MIRIAM beamline of the Diamond Light Source, Harwell, United Kingdom



 Click here to speak to a Nanonics specialist about the SpectraView MV 2500.


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