flyerAPS V4 banner onpage


SpectraView 2500

 Integrating Scattering Techniques with Ultrasensitive SPM/AFM


A Breakthrough in Combining Complementary Scattering Techniques with Ultrasensitive AFM and SPM for NanoChemical Analysis





  • Colocalized IR, Raman, THz and AFM
  • Singular protocols for excitation in the IR with Raman and fluorescence detection in the visible
  • Image with photon force with pN force sensitivity
  • Patented cantilevered completely transparent probes
  • Highly localized scattering at the tip
  • Versatile configurations with advanced SPM modes of operation: Kelvin Probe chemical potential, electrical, thermal and photon force detection
  • Online variable magnetic fields
  • Applications in plasmonics of 2D materials, liquids, biology etc.





AFM (Left) and IR (right) images obtained with broadband IR illumination (1000-4000cm-1) at the MIRIAM beamline of the Diamond Light Source, Harwell, United Kingdom



 Click here to speak to a Nanonics specialist about the SpectraView MV 2500.


Do you have a question about a product?

Are you interested in a quote?

We can help!



Let's set up a time to speak briefly about your unique SPM needs.

Thanks for visiting!


Just before you go...


Would you like to take a quick look at how you can improve your research or industrial application?