SpectraView Multiprobe: Up to 4 AFMs in 1 System
Four probes operate simultaneously and independently, with each probe having its own feedback and scanning capabilities. Measure sophisticated properties only possible with the availability of multiple probes such as electrical, thermal and optical properties of devices. The MultiView 4000 is a novel platform containing multiple probes/AFMs for advanced experiments such as: nanoscale transport, optical pump-probe, and read-write experiments.
The MV 4000 continues the tradition of the MV series, providing total optical flexibility and customization possibilities. Now, AFM Raman and Tip Enhanced Raman Spectroscopy (TERS) can be integrated with the multiprobe capability. In addition, free optical access from above allows easy visualization of all probes and facilitates nanomanipulation.
Probing multiple dimensions of your sample - Read more
Nanoscale Transport - Read more
Advanced SPM measurements with best topography - Read more
Nano Pump Probe studies - Read more
Nanoscale Manipulation and Measurement - Read more
The simultaneous and independent SPM probe operation of up to 4 probes enables full characterization of all dimensions of samples and devices. All forms of SPM are enabled for each individual probe accompanied by total optical integration resulting in access to all modes including AFM, KPM, EFM, ANSOM, NSOM, STM, AFM-Raman, and TERS. Because these probes are designed for multiple probe operation, they can be brought to a nanometric separation distance thus ensuring that the same area is scanned with all the probes.
Multiprobe capability is especially useful for electrical measurements since multiple probes can now be placed over the element to provide bias or probe its conductivity, resistance, etc just like in a probe station. Two-, three-, or four-point resistance measurements are possible. Multiple probes also enable flexible positioning and manipulation to provide bias, localized I-V measurements, and multichannel imaging.
One probe can be the source of excitation while the second probe follows the transport process with high spatial resolution. Alternatively, optical pump/probe experiments can now be performed using one probe to optically pump while the other probe measures the optical output in a variety of configurations. An example of each type of measurement is shown below.
Thermal transport measurement within an SRAM device where heat is introduced at specific locations and detected at other locations. As contact is made in different regions of the SRAM with the thermal conductivity probe, the probe tip cools to different levels depending on the material's thermal conductivity. The resulting image is obtained by determining the current alterations that had to to be affected in order to keep the current flowing past the point resistance at a constant value.
With two cantilever, near-field optical probes with exposed tips, light is injected through one probe and is guided through the sample which is a fiber. With the second probe in place, this injected light can be collected and analyzed both spatially and temporally. In this image two NSOM probes are seen in AFM contact with the input and output of the fiber waveguide.
See a video showing an example using multiprobe technology to conduct nanothermal measurements here.
With a multiprobe system, resolution and tip quality no longer need to be compromised since each probe is now individualized for each measurement. In classic NSOM setups the NSOM probe would have the dual function of imaging topography and fluorescence where the topography image is compromised by the aperture (wider diameter) needed by the NSOM probe. But in a multiprobe setup, a standard SPM probe can be used the topography without affecting the NSOM fluorescence measurement.
The left and center images are the topography and fluorescence images, respectively, of lumogen dye particles collected in a multiprobe setup with different probes for topography and NSOM. The image on the right is the topography image of the same sample but collected with the NSOM probe, revealing the clear loss of resolution and morphology. The width of each image is 8um.
One probe can be used for moving, cutting, or positioning a sample, while the other probe can be used to image the sample. For example, shown below is a chromosome that has been dissected with one probe (see image on left), while the other probes images the result of the nanomanipulation.
| (Left) MultiView 4000TM four SPM probes platform. (Middle) MultiView 4000TM Tip and
Sample scanning stages. (Right) Optical image of online four SPM probes in feedback.
|The images above show the procedure that can be implemented to bring two or more probes in close proximity to one another. Specifically in the images shown the common features in a carbon nanotube sample are imaged by two probes and from these images it is clear that the two probes are displaced along the y axis by 300nm and along the x axis by 1.7microns|
Independent and simultaneous scanning of up to 4 probes for atomic force, near-field, optical, and all known scanning probe microscopy imaging modes.
Modular Design Open Architecture. Read more
3D Flatscan Scanner Technology. Read more
Spatially Friendly Glass Probes. Read more
Ultrasensitive Tuning Fork Feedback. Read more
Total Scanning Flexibility. Read more
The unique, modular design of the MultiView 4000 allows for the upgrade from one probe to two, three or four probes. The MultiView 4000 offers a completely free optical axis from above the probe, below the sample and 270 degrees around the probe. Tbhe Multiview 4000 boasts a 4.5mm working distance from above the probe for ultrahigh resolution optical or electron/optical viewing probes on opaque samples.
|Start with one Probe||Upgrade to two probes||Upgrade to four probes|
The design of the 3D Flatscan is a novel planar, folded-piezo flexure scan design that keeps the probes separated. The large vertical (axial) displacement of up to 100 microns allows for the use of multiple probes as well as the tracking of structures with very large topographical features. The minimal scanner height of 7mm allows for easy access with high powered microscope objectives from either above or below the scanning stages.
While typical probes do not permit close proximity of probe tips, Nanonics has developed spatially and optically friendly glass based probes that allow for a close approach of the probe tips to within nm, as well as independent scanning of each probe. Nanonics' glass based probes offer excellent imaging in AFM modes, unparalleled aspect ratios, and support deep trench imaging as well as side wall imaging. They also permit singular electrical imaging and thermal imaging with glass encased nanowires.
|Nanonics' patented bent cantilevered glass probe||Online dual probes in contact with AFM feedback (side view)||Online four probes in contact with AFM feedback (top view 500x magnifications)|
For a further explanation of this feedback mechanism, see our tutorial.
The MultiView 4000 provides both tip and sample scanning so that the user can select which mode of operation best suits their experimental needs. For example, a sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner. On the other hand, the tip scanning stage means that the tip can be scanned while the illumination point is held constant.
Dual Configuration for Optical Pump/Probe. Read more
Cantilever probes for superior NSOM performance. Read more
Completely flexible optical access. Read more
All modes of NSOM. Read more
Two cantilever, near-field optical probes with exposed tips, light is injected through one probe and is guided through the sample which is a fiber. With the second probe in place, this injected light can be collected and analyzed both spatially and temporally. In this image two NSOM probes are seen in AFM contact with the input and output of the fiber waveguide.
Application Example: Dual Probe NSOM and AFM Excitation and Detection of Surface Plasmons on a Waveguide
Two NSOM probes can be used for illumination and collection on plasmon-polariton waveguides. One probe is a lensed fiber to excite the plasmons in the waveguide, where a laser is coupled into this probe, which is in contact with the launching pad of the waveguide. This probe is for excitation purposes and does not scan. A second NSOM probe scanned across the waveguide at different locations to collect the evanescent field and imaging of the surface plasmons distribution. Shown on the right are a topography (top) and corresponding NSOM (bottom) images at two magnifications collected with multiple probes. The image on right demonstrates the plasmonic propagation distance and the image on right shows the plasmonic location with high resolution.
Application Example: Near-field Excitation and Apertureless Collection of SPPs
Multiple probes can be used to independently excite and collect light, enabling optimization of each individual probe. In this example on surface plasmon polaritons (SPPs), the left tip is apertured to provide near-field SPP excitation. The apertureless right tip provides near-field scattering and collection of the SPP. A schematic of this setup is shown here.
The apertured probe is required for excitation so that it can produce an evanescent field with a spectrum of k vectors to effectively excite the SPPs on the surface. However, for detection, the apertureless probe is preferred and can operate in tunneling mode in order to scatter the SPPs and directly collect the photons produced by such scattering. The resulting data is shown below where the NSOM data is overlaid onto the 3D topography showing the SPP mode propagation and associated exponential decay.
Nanonics is the global pioneer in glass probe manufacturing and has developed a whole suite of probes for all your NSOM applications in our Nanotoolkit that are compatible with the MultiView 2000 system, featuring:
-Glass cantilevered normal force probes. These types of probes operate as standard robust AFM probes for easy, high-quality imaging of all samples. Additionally, the geometry of these probes provides unobstructed optical view from above and below
-Fiber probes with metallic nanoparticles in tip
-Straight probes also available for shear force feedback measurements
This enables total flexibility in your NSOM setup, as the MultiView 4000 can be integrated with any optical microscope. Additionally, total optical access to sample and probe position from above is possible since the cantilever probe/scanner assembly does not obscure access
Collection mode NSOM is depicted in the schematic below, where the light illuminates the sample, and then is collected through the NSOM probe by a detector. The MultiView 4000 offers both tip scanning and a sample scanning stage with upto four probes that can scan independently and simultaneously. A sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner. This instrumentation design is ideal for true collection mode NSOM.
For an explanation of all modes of NSOM, please see the NSOM tutorial.
True reflection mode NSOM
In true reflection mode, light is introduced via the NSOM probe, and then collected by a detector above the probe as shown in the schematic below. True Reflection mode NSOM is possible on the MultiView 4000 due to the use of transparent, cantilever probes. Furthermore, the design of the MultiView series separates the excitation and collection paths so that they don't affect each other, thus enabling true reflection mode NSOM measurements to be conducted. Other designs that take advantage of straight probes or apertured Si probes are significantly more challenging for true reflection mode.
-For an explanation of all the different modes of NSOM, including transmission, reflection, collection, and illumination modes, please see the NSOM tutorial page.
Examples. See Photos
Graphene bridge application. Read more
Tuning fork feedback without laser interference. Read more
Effortless AFM and Raman integration. Read more
Built for TERS operation. Read more
Best TERS probes. Read more
Autofocus for superior Raman. Read more
Raman in fluids. Read more
A dual probe MV4000 system integrated with a Raman spectromer studied the electrical and chemical properties of a graphene bridge that was connected between electrical pads. Two cantilever electrical probes (Nanonics) were brought down to the electrical pads. The variable electrical voltage was applied to the substrate and the current between the electrical probes through the graphene was measured. The Raman signal was collected from the graphene simultaneously with the electrical measurements.
The MultiView 4000 is equipped with a laser-free feedback method called normal force tuning fork feedback. For example, many SPM laser-based feedback systems employ red lasers, which would then interfere with the Raman emission in the redo from the sample. The MultiView 4000 gets rid of all problems associated with optical interference in your Raman experiments.
The MV 4000 can be combined with either an upright, inverted, or a dual microscope (combined upright and inverted) where the same SPM head is used for either microscope configurations. No modification of the Raman path is necessary to accomodate the SPM tip and head. This design results in a natural and straightforward Raman path for integration without the need for tilting or bending the Raman path to accomodate the SPM. Furthermore, transparent optical AFM probes provide a completely transparent optical system. Both reflection Raman and transmission Raman are standard on the MV 4000. Side illumination is also available. This sytem is compatible with 100x, NA 0.8 optical objective from the top and high numerical aperture oil immersion objectives from the bottom.
Detection: Combined tip and sample scanning stage within the same scanning system provides accurate positioning of the probe at the ideal location for TERS with respect to the focused laser spot. Tip can be positioned within the center of the Raman hotspot for optimal TERS signal detection
Sample can be imaged with the sample scanning piezo stage without losing the TERS hotspot position.
All modes of TERS including STM and AFM-TERS with easy interchangeability are available. Thus the same probe (either conducting or with a conductive coating for STM-based feedback) can operate in AFM feedback using tuning fork based feedback for TERS measurements, and then it can be switched to tunneling based feedback for TERS operation in gap mode.
TERS on non-conducting surfaces
Availability of the upper XYZ piezo scanner for the tip scanning enables 3 point TERS measurements for comparing the difference between enhanced and non-enhanced spectra and extracting new information.
Nanonics TERS probes are supplied bent in the range of 45-60 degrees, the optimal angle for TERS excitation
The MV 4000 provides autofocusing onto the sample at every pixel point. Thus for rough samples, tilted samples, or samples with unusual Z variation, the MultiView 4000 provides the best Raman resolution as it makes sure to have the sample in focus at every point a Raman spectrum is collected
Raman imaging in fluids is done with the water immersion objective. The advantages of the water immersion objectives are described in the tutorial . In addition, Raman can be combined with other functionalities such as scanning electrochemical microscopy (SECM). A description of combined Raman-SECM with an application of in situ monitoring Cu etching can be viewed here or downloaded by clicking here .
IIntegrate with Raman Spectroscopy
Integrate with a standard commercial Raman microprobe optical microscope with no intervening optical fibers
Background free Raman measurements
Laser-free tuning fork feedback method replaces laser-based feedback
Optically transparent cantilever glass probes
Perform tip enhanced Raman spectroscopy (TERS)
Cantilever nanopipette glass probes having single gold nanoparticles grown in tip
Full integration with upright, inverted or dual (4Pi) optical microscopes
Full integration with non-linear and multi-photon microscopes (e.g. second harmonic generation microscopes)
Completely free optical axis from above and below the sample
Complete freedom of optical microscopy nose piece rotation from above or below
Open system architecture providing transmission, reflection, and collection modes
MultiView 4000TM/HORIBA Xplora Raman Integration Package
MultiView 4000TM/Renishaw Invia Raman Integration Package
Multiprobe operation inside environmental chamber
Free optical axis from top and bottom - complete optical integration with dual optical microscope
T control - heating and cooling
MultiView 4000TM Two Probe system fully integrated inside environmental chamber on a dual optical microscope with complete free optical axis