Multiview 2000

Advanced & Fully Featured SPM

Page7 SingleProbe1

The MultiView 2000TM series is an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/AFM Raman/TERS imaging without perturbation.  The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning.  This versatility is important for different operation modes where the user can now choose whether the sample or tip is static.  The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation.  This feedback mechanism offers the most stability, as well as laser-free operation for the most sensitive experiments.

For additional info, please contact us at info@nanonics.co.il or visit our contact us page.

 

 

Key Features

Designed for ease-of-use and flexibility.  Read more

Largest commercially available z scan range.  Read more

Excellent SPM platform with wide variety of probes.  Read more

Any optical configuration.  Read more

Irregular Sample Size Compatibility.  Read more

Designed for Ease-of-Use and Flexibility

Dual sample and tip scanning stages in the same head for ultimate flexibility is coupled with an optically friendly Nanonics 3D Flat ScanTM stage providing up to 85μ in X, Y and Z or 170μ in X, Y and Z using combined scanners. This scanner is also suitable for large samples with unconventional geometries.  Closed loop is an option for positioning accuracy of 20nm.

Additionally, a revolutionary, alignment-free feedback system provides the most sensitive tip-sample stability.  Normal force feedback with tuning fork actuation provides no alignment, laser-free operation for improved optical signal to noise ratio, and ultra-sensitive force spectroscopy perfect for force and adhesion measurements.

Read more for more information and details about tuning fork feedback

 

Largest Commercially Available Z Range 

The large, 85μ X, Y and Z-range of the Nanonics 3D FlatscanTM makes it ideal for optical sectioning in confocal imaging. Used in this way, the MultiView 2000TM integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system 

 

Excellent SPM platform compatible with wide variety of probes

Nanonics provides a wide variety of probes that are compatible with the MultiView 2000TM, including: transparent, cantilevered probes, thermal probes, electrical probes (electrochemical probes, coax probes, glass insulated wire probes) and all third party silicon probes

 

 Any Optical Configuration

The unique geometry of the MultiView 2000TM head and cantilever probes leaves the optical axis free both above and below the sample for integration with upright, inverted, and dual optical microscope configurations.

 

 Irregular Sample Size Compatibility

Irregular sample sizes, whether odd in shape or large in size, can be easily placed on the sample stage.

 

 

The sample can even be suspended from the unobstructed flat scanning sample stage in order to examine the edges of the sample.

 

NSOM Integrations

 All modes of NSOM.  Read more

Transparent, cantilevered probes for best NSOM performance.  Read more

Completely flexible optical access designed for NSOM operation.  Read more

All modes of NSOM

True Collection Mode

The MultiView 2000 offers both tip scanning and a sample scanning stage.  A sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner.  A tip scanning stage means that the tip can be scanned while the illumination point (either from above or below) is held static.  

For an explanation of all modes of NSOM, please see the tutorial on NSOM modes.  This instrument design is ideal for true collection mode NSOM, where the light illuminates the sample, and then collected through the NSOM probe by a detector (see schematic on right).

True reflection mode NSOM

NSOM REFLECTION MODE

In true reflection mode,  light is introduced via the NSOM probe, and then collected by a detector above the probe as shown in the schematic below. The design of the MultiView series take advantage of transparent probes and separates the excitation and collection paths so that they don't affect each other.  Other designs that take advantage of straight probes or apertured Si probes are significantly more challenging for reflection mode NSOM experiments.

-More on different modes of NSOM can be found on the NSOM tutorial page.

Transparent, cantilevered probes for the best NSOM performance

Nanonics is the global pioneer in glass probe manufacturing and has developed a whole suite of probes for all your NSOM applications featuring:

-Glass cantilevered normal force probes.  These types of probes operate as standard robust AFM probes for easy, high-quality imaging of all samples.  Additionally, the optical transparency of these probes provides unobstructed optical view from above and below

-Efficient Apertureless NSOM probes

-Fiber probes with metallic nanoparticles in tip

-Straight probes also available for shear force feedback measurements 

Completely flexible optical access designed for NSOM operation 

This enables total flexibility in your NSOM setup, as the MultiView 2000 can be integrated with any optical microscope.  Additionally, total optical access to sample and probe position from above is possible since the cantilever probe/scanner assembly does not obscure access

 

 

Learn more about the SpectraView MV2500, ideal for Scattering & Apertureless NSOM

 

Back to NSOM Solutions page

 

Raman Integrations

 

The Nanonics MV 2000 can be transparently integrated WITH ANY Raman System.

 

Choose from 1 of 4 possible configurations. (Click below for more information.)

1. Direct Integration on the stage of any Raman System 
2. Integration with an additional microscope
3. Integration with your choice of monochromater & CCD
4. Fiber Integration

 

 

1. Direct Integration on the stage of any Raman System

a. Nanonics MV 2000 - Renishaw Raman

MV 2000 AFM Raman Integration Renishaw

b. Nanonics MV 2000 - Horiba XploRA Raman

MV 2000 AFM Raman Integration Horiba

c. Nanonics MV 2000 - Bruker Raman

MV 2000 AFM Raman Integration Bruker

 

d. Nanonics MV 2000 - Thermo Fisher Raman

MV 2000 AFM Raman Integration Thermo

 
2.  Integration with an additional microscope

Keep your Raman microscope free for general application, and use the Nanonics Integration Package for the ultimate in AFM-Raman.

AFM Raman Integration 1 

AFM Raman Integration 2

 
3. Integration with your choice of monochromater & CCD

AFM Raman Integration 3

 
4. Fiber Integration

 

 

SEM & FIB Integrations

 

Example Photo. 

 

Application Examples. Read more.

Application Examples:

Additional Integrations

MultiView 2000TM On-line Integrations

 

   Optical Microscopy

Integration Package

Raman Integration

 

 

 

SEM/FIB/Ion Beam

Glove Box/ Environmental Control

High Vacuum Integration

 

 

 

 

Transparent Optical Microscopy

  • MultiView 2000TM allows for transparent integration with true confocal optical microscopy, including upright, inverted and dual configurations.
  • Complete free optical axis from top and bottom with powerful objectives having large NA, including water and oil immersion objectives 
  • Near-field and far-field optical measurements of NSOM transmission, reflection & collection, fluorescence, sSNOM and confocal DIC measurements
 

Free optical axis of MultiView 2000TM allows for transparent integration with dual optical microscope configurations.

 

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Integration Package

  • Ultra stable platform for on-line hard optical coupling of an SPM with: 
    - Raman
    - Fluorescence/Photoluminescence 
    - Non-linear optics
  • Optimal SPM performance with full isolation from on-line noises of Femto-second lasers and CCDs, as well as environmental noises
  • Free optical axes of inverted, upright and 4pi configurations of optical microscopes with infinity corrected lenses that have parallel beams perpendicular to the sample stage
   

Integration Package allows for complete isolation of MultiView 2000TMfrom noise sources with high optical throughput of hard coupling.

 

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Raman Integration

  • Direct mounting of MultiView 2000TM on various confocal Raman microscopes such as Renishaw PLC, Horiba Jobin Yvon and Bruker Optics.
  • Free optical axis from top and bottom of upright and inverted optical microscopes for online AFM/Raman and TERS measurements
   

 MultiView 2000TM mounted on HORIBA Jobin Yvon's Xplora Raman spectrometer

 MultiView 2000TM mounted on Renishaw ‘s Invia Raman spectrometer

 

Raman Integration
   

6x6µm2 AFM image of a state-of-the art transistor.

On-line correlating Raman map of the strained silicon 400cm-1 peak.

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SEM/FIB/Ion Beam Integration

  • Vacuum compatible SPM head for integration with SEM/FIB/ion beam systems
  • Clear electron and optical axes for on-line AFM/NSOM with SEM/FIB/ion beam operation
 
   Complete transparency of MultiView 2000TM inside SEM chamber.

 

 

   

Near-field Cathodoluminescence from a GaN nanowire under ion beam excitation obtained with MultiView 2000TM inside an SEM chamber. On-line AFM (left) and NSOM (right) images obtained in collection mode. The NSOM image shows an evanescent light decay along the nanowire and light distribution at the nanowire output

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Glove Box Integration/Environmental Control

  • Sealed container designed to allows manipulation of the MultiView 2000TM head in a Glove Box for controlled atmosphere of inert gas, vacuum, humidity and chemicals.
  • Transparent optical axis for integration with optical microscopy
   

Environmental chamber for MultiView 2000TM suitable for Glove Box integration with free optical axis. (Right) Environmental chamber scheme side and top view.

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High Vacuum Integrations

  • Compatible with high vacuum chambers with integration into optical microscopes and free optical axes from top and bottom
  • Monitored humidity-control capabilities ranging from 5% - 95%
  • Cooling to 4oC and heating to 40oC inside the chamber
  • Inlets for additional environmental-control substances, including gas inlets
  • Optical fiber inlets
 
   Flexible integration of MultiView 2000TM inside high vacuum chambers with free Z optical axis.

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Liquid Cell Integration

 

A new frontier in integrated microscopy has arrived with the introduction of a unique liquid cell AFM/SPM LC 2000 TM for the Nanonics AFM/SPM 2000 Confocal Microscope TM that is shown below.  This microscope system with liquid cell in place allows for the first time a high power low working distance (3.5 mm) water immersion objective from above and oil immersion objective from below and permits temperature control. This allows for efficient collection of fluorescent and other light fully correlated with atomic force microscopy imaging.

 

 

 

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