Advanced, Fully Featured SPM
The MultiView 2000TM series is an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/AFM Raman/TERS imaging without perturbation. The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning. This versatility is important for different operation modes where the user can now choose whether the sample or tip is static. The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation. This feedback mechanism offers the most stability, as well as laser-free operation for the most sensitive experiments.
The MV 2000TM product brochure can be downloaded here.
For additional info, please contact us at email@example.com or visit our contact us page.
Designed for ease-of-use and flexibility. Read more
Largest commercially available z scan range. Read more
Excellent SPM platform with wide variety of probes. Read more
Any optical configuration. Read more
Irregular Sample Size Compatibility. Read more
Dual sample and tip scanning stages in the same head for ultimate flexibility is coupled with an optically friendly Nanonics 3D Flat ScanTM stage providing up to 85μ in X, Y and Z or 170μ in X, Y and Z using combined scanners. This scanner is also suitable for large samples with unconventional geometries. Closed loop is an option for positioning accuracy of 20nm.
Additionally, a revolutionary, alignment-free feedback system provides the most sensitive tip-sample stability. Normal force feedback with tuning fork actuation provides no alignment, laser-free operation for improved optical signal to noise ratio, and ultra-sensitive force spectroscopy perfect for force and adhesion measurements.
Read more for more information and details about tuning fork feedback
The large, 85μ X, Y and Z-range of the Nanonics 3D FlatscanTM makes it ideal for optical sectioning in confocal imaging. Used in this way, the MultiView 2000TM integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system
Nanonics provides a wide variety of probes that are compatible with the MultiView 2000TM, including: transparent, cantilevered probes, thermal probes, electrical probes (electrochemical probes, coax probes, glass insulated wire probes) and all third party silicon probes
The unique geometry of the MultiView 2000TM head and cantilever probes leaves the optical axis free both above and below the sample for integration with upright, inverted, and dual optical microscope configurations.
Irregular sample sizes, whether odd in shape or large in size, can be easily placed on the sample stage.
The sample can even be suspended from the unobstructed flat scanning sample stage in order to examine the edges of the sample.
All modes of NSOM. Read more
Transparent, cantilevered probes for best NSOM performance. Read more
Completely flexible optical access designed for NSOM operation. Read more
True Collection Mode
The MultiView 2000 offers both tip scanning and a sample scanning stage. A sample scanning stage enables easy and rapid alignment of the sample relative to the illumination source and ensures that the microscope optics are independent of the AFM scanner. A tip scanning stage means that the tip can be scanned while the illumination point (either from above or below) is held static.
For an explanation of all modes of NSOM, please see the tutorial on NSOM modes. This instrument design is ideal for true collection mode NSOM, where the light illuminates the sample, and then collected through the NSOM probe by a detector (see schematic on right).
True reflection mode NSOM
In true reflection mode, light is introduced via the NSOM probe, and then collected by a detector above the probe as shown in the schematic below. The design of the MultiView series take advantage of transparent probes and separates the excitation and collection paths so that they don't affect each other. Other designs that take advantage of straight probes or apertured Si probes are significantly more challenging for reflection mode NSOM experiments.
-More on different modes of NSOM can be found on the NSOM tutorial page.
Nanonics is the global pioneer in glass probe manufacturing and has developed a whole suite of probes for all your NSOM applications featuring:
-Glass cantilevered normal force probes. These types of probes operate as standard robust AFM probes for easy, high-quality imaging of all samples. Additionally, the optical transparency of these probes provides unobstructed optical view from above and below
-Fiber probes with metallic nanoparticles in tip
-Straight probes also available for shear force feedback measurements
This enables total flexibility in your NSOM setup, as the MultiView 2000 can be integrated with any optical microscope. Additionally, total optical access to sample and probe position from above is possible since the cantilever probe/scanner assembly does not obscure access
The Nanonics MV 2000 can be transparently integrated WITH ANY Raman System.
Choose from 1 of 4 possible configurations. (Click below for more information.)
1. Direct Integration on the stage of any Raman System
a. Nanonics MV 2000 - Renishaw Raman
b. Nanonics MV 2000 - Horiba XploRA Raman
c. Nanonics MV 2000 - Bruker Raman
d. Nanonics MV 2000 - Thermo Fisher Raman
2. Integration with an additional microscope
Keep your Raman microscope free for general application, and use the Nanonics Integration Package for the ultimate in AFM-Raman.
Glove Box/ Environmental Control
High Vacuum Integration
- MultiView 2000TM allows for transparent integration with true confocal optical microscopy, including upright, inverted and dual configurations.
- Complete free optical axis from top and bottom with powerful objectives having large NA, including water and oil immersion objectives
- Near-field and far-field optical measurements of NSOM transmission, reflection & collection, fluorescence, sSNOM and confocal DIC measurements
Free optical axis of MultiView 2000TM allows for transparent integration with dual optical microscope configurations.
- Ultra stable platform for on-line hard optical coupling of an SPM with:
- Non-linear optics
- Optimal SPM performance with full isolation from on-line noises of Femto-second lasers and CCDs, as well as environmental noises
- Free optical axes of inverted, upright and 4pi configurations of optical microscopes with infinity corrected lenses that have parallel beams perpendicular to the sample stage
Integration Package allows for complete isolation of MultiView 2000TMfrom noise sources with high optical throughput of hard coupling.
- Direct mounting of MultiView 2000TM on various confocal Raman microscopes such as Renishaw PLC, Horiba Jobin Yvon and Bruker Optics.
- Free optical axis from top and bottom of upright and inverted optical microscopes for online AFM/Raman and TERS measurements
MultiView 2000TM mounted on HORIBA Jobin Yvon's Xplora Raman spectrometer
MultiView 2000TM mounted on Renishaw ‘s Invia Raman spectrometer
6x6µm2 AFM image of a state-of-the art transistor.
On-line correlating Raman map of the strained silicon 400cm-1 peak.
- Vacuum compatible SPM head for integration with SEM/FIB/ion beam systems
- Clear electron and optical axes for on-line AFM/NSOM with SEM/FIB/ion beam operation
|Complete transparency of MultiView 2000TM inside SEM chamber.|
Near-field Cathodoluminescence from a GaN nanowire under ion beam excitation obtained with MultiView 2000TM inside an SEM chamber. On-line AFM (left) and NSOM (right) images obtained in collection mode. The NSOM image shows an evanescent light decay along the nanowire and light distribution at the nanowire output
- Sealed container designed to allows manipulation of the MultiView 2000TM head in a Glove Box for controlled atmosphere of inert gas, vacuum, humidity and chemicals.
- Transparent optical axis for integration with optical microscopy
Environmental chamber for MultiView 2000TM suitable for Glove Box integration with free optical axis. (Right) Environmental chamber scheme side and top view.
- Compatible with high vacuum chambers with integration into optical microscopes and free optical axes from top and bottom
- Monitored humidity-control capabilities ranging from 5% - 95%
- Cooling to 4oC and heating to 40oC inside the chamber
- Inlets for additional environmental-control substances, including gas inlets
- Optical fiber inlets
|Flexible integration of MultiView 2000TM inside high vacuum chambers with free Z optical axis.|
Liquid Cell Integration
A new frontier in integrated microscopy has arrived with the introduction of a unique liquid cell AFM/SPM LC 2000 TM for the Nanonics AFM/SPM 2000 Confocal Microscope TM that is shown below. This microscope system with liquid cell in place allows for the first time a high power low working distance (3.5 mm) water immersion objective from above and oil immersion objective from below and permits temperature control. This allows for efficient collection of fluorescent and other light fully correlated with atomic force microscopy imaging.