Electrical Probes

 

Nanonics produces a variety of conductive cantilevered and straight probes for simultaneous AFM and conductive measurements:

Gold Coated Fiber Probes

Single Wire Electrodes

Coaxial Shielded Electrodes

Double Wire Electrodes

 

Gold Coated Fiber Probes

 

Conductive AFMElectric Probe PageGold coated Nanonics glass AFM fiber tips can serve as excellent electrical probes for spreading resistance microscopy and AFM imaging, allowing electrical characteristics of a sample to be correlated with its surface topography.  In addition, these probes are optically friendly for integration with AFM-Raman.

 

 

Specifications

PROBE MATERIAL

Quartz

COATING

Au

TIP DIAMETER

greater than or equal to 50 nm

TOTAL LENGTH

5mm-5cm

BEND ANGLE

30°-90°

FORCE CONSTANT

20-40N/m

RESONANCE FREQUENCY

20-100 kHz for beam bounce feedback

32.4kHz for Tuning fork feedback

 

 


 

Single Wire Electrodes

Single Wire 1Sinlge Wire 2Nanonics produces unique cantilevered single wire electrodes for conductive atomic force microscopy. The electrodes are metal noble wire sealed into glass and pulled to the nano metric apex.

 

 

 

Specifications

PIPETTE MATERIALS

Borosilicate glass

INNER ELECTRODE MATERIAL

Pt, Ag, Au, other materials are available

TIP DIAMETER

greater than or equal to 100nm

STARTING WIRE DIAMETER

25um or 50um

FORCE CONSTANT

50-100 N/m

RESONANCE FREQUENCY

20-100 kHz for beam bounce feedback

32.4kHz for Tuning fork feedback

 

In addition to the electrical measurements, the electrode can operate as an electrochemical and coaxial probe. 

 

Coaxial Shielded Electrodes

Picture3Coaxial shielded probes are single wire probe with gold coating shield. This probe operates as a coaxial cable and can be used for characterization of the conductive properties.

 

 

 

 

Double Wire Electrodes

Picture1Picture2In the Double-Wire Electrode probe, two platinum wires are tapered inside a dual-channel nanopipette and kept electrically isolated. They can be used to perform electrical measurements on submicron-scale devices, such as resistance and capacitance modes. Because the probes use normal-force feedback to stay in contact with the surface, these electrical measurements can be correlated with the surface topography obtained through the simultaneous AFM imaging.

 

Specifications

PIPETTE MATERIALS

Borosilicate glass

ELECTRODE MATERIAL

Pt

TIP DIAMETER

greater than or equal to 300nm

STARTING WIRE DIAMETER

25um

FORCE CONSTANT

50-100N/m

RESONANCE FREQUENCY

20-100 kHz for beam bounce feedback

32.4kHz for Tuning fork feedback

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Key Features

1. Exposed Tip for Optical and Spectral Transparency

 

 

Standard Conductive Probes
Nanonics Conductive Probes
Does not obscure optical axis from above and below for full integration and optical microscopes, Raman spectrometers, FTIR spectrometer and other optical modailities.

 

 

 

2. Multiprobe Capabilities

  

Cantlievered shape and exposed tip enable to bring the tips of two electircal probes in AFM feedback within nanometric distance one to another. The multiprobe system with electrical probes functions as electrical probe station.






 

 

 

 

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