Coaxial Shielded STM Probes

Coaxial probes consist of a tapered metal wire running through a metal-coated, glass nanopipette. The wire may protrude slightly from the coated nanopipette edge and it remains exposed at the tip. The metal coating on the insulating glass provides the wire with the necessary electrical shielding required for sensitive STM measurements.  

 


Cantilevered Coaxial Probe for sensitive STM measurements   

SEM of the 7nm 
metal tip of a 
Cantilevered Coaxial Probe

1.6x1.2nm STM
image of HOPG

Coaxial Probes Specifications

Pipette material

Borosilicate glass

Electrode Diameter

>10 nm

Insulator Thickness

> 200 nm

Shank diameter

1.0-1.5 mm

Taper length

3-10 mm

Total length

5 mm- 5 cm

Electrode material

Pt, Pt-Ir, Ag or Au (standard), other metals available

Coating material

Ag, Au, Al, Cr or Ni

Tip diameter

>100 nm

Starting Wire diameter

25 or 50 µm

Tip profile

Flat end to 1µm protrusion (custom designs available)

Cantilever Characteristics

Cantilever Height

50 µm - 500 µm (Deep Trench probes available)

Cantilever Length

300- 1000 µm

Force Constant

5-20 N/m

Resonant Frequency

20-390 kHz

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