AFM Probes

Nanonics produces cantilevered AFM probes using glass pulling technology. This technology allows the varying of tip dimensions, angle of bending, aspect ratio, and cantilever length in a wide range. The probes are made of fused silica that is almost transparent. AFM Probes - Image

Click here for more information on probes and how to order

Nanonics produces cantilevered AFM probes using glass pulling technology. This technology allows the varying of tip dimensions, angle of bending, aspect ratio, and cantilever length in a wide range. The probes are made of fused silica that is almost transparent.

Key Features 


Exposed Tip

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Provides complete optical access from above and below for full integration with optical microscopes, Raman spectrometers, FTIR spectrometer and other optical modalities.

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Standard AFM's
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Nanonics AFM

OPTICAL AND SPECTRAL TRANSPARENCY

AFM Probe is made from fused silica which do not have optical and Raman signature and thus prevent any the optical interference in combined AFM/Raman, AFM/Confocal measurements

HIGH ASPECT RATIO

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The high aspect ratio probes with small opening angle enables scanning of deep trench structures and side walls.

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MULTIPROBE CAPABILITIES

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Cantilevered shape and exposed tip enable to bring the tips of two probes in AFM feedback within nanometric distance one to another.

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Specifications:
TIP RADIUS
TIP LENGTH
ANGLE OF BENDING
CANTILEVER LENGTH
FORCE CONSTANT (BEAM BOUNCE/LASER BASED FEEDBACK)
RESONANSE FREQUENCY ( TUNING FORK FEEDBACK)
COATING 
Standard: 10nm
Supersharp:<5 nm
50-500um
30°-90 °
50-1000um
from <1N/m to >10N/m
32.4 kHz
Au, Ag, Cr, Co, Ni coating available

**Straight probes are available


DEEP TRENCH IMAGING

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Trench profiling is a must for FIB etching for monitoring quality of the etching. Standard AFM systems fail in profiling deep trenches due to limitations of Z range and tip aspect ratio. Nanonics SPM systems provide large Z range of up to 170 microns and cantilevered glass probes with high aspect ratio.

 

 

 

 

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pic9Side Wall Imaging

Cantilevered and straight nanopipette probes can be filled with fluorescent materials. These active light sources can be provided with a variety of sensing capabilities. Sensors are currently available for H+, Na+, K+, Ca2+ and Cl-, other sensors are also available upon request.

 

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Customizing

Wide range of the angles of bending, cantilever length, bending length, aspect ratio and coatings to meet needs of your sample geometry are available.

 

AFM Probes with Different Angles of Bending

AFM High Aspect Ratio and Length of Bending Probes

 

AFM Probes with Curvature Tip for Soft Materials and Nanoindentation

 

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