 August 10, 2010 - International Conference on Raman Spectroscopy 2010 - Boston, MA
Probe and Instrument Development for Tip Enhanced Raman Scattering & Shadow Near-Field Scanning Optical Microscopy was the title of the talk given by Professor Aaron Lewis of Nanonics at this year's 22nd annual International Conference on Raman Spectroscopy (ICORS 2010).
 In this significant talk, Professor Lewis gave a brief history of Tip-Enhanced Raman Scattering (TERS) and the contribution of Nanonics to this growing field. He further described the research that has focused on optimizing the essential components of instrumentation and probes for TERS and associated techniques based on full integration of scanned probe microscopy with microRaman spectroscopy. The results of this research effort have allowed for a general TERS solution that can be applied for both opaque and transparent samples. It also permits for integration with all upright, inverted and dual 4 Pi microscope solutions.
See the full presentation here.
For more information about our simultaneous AFM-Raman and TERS solutions visit us at http://www.nanonics.co.il/index.php?page_id=255.
Professor Aaron Lewis holds the Eric Samson Chair in Applied Science and Technology at the Hebrew University of Jerusalem. He joined the faculty of The Hebrew University in 1986 from the position of Professor of Applied Physics at Cornell University. Professor Lewis' research has centered on unique ways to confine, manipulate and analyze light in nanometric domains. As part of this effort he developed Near-field ical images that have ever been achieved. This is accomplished by the spatial confinement of light and has allowed optical imaging to enter the nanoworld. For his seminal contributions to the development of the field of near-field optical imaging with its growing importance in a variety of areas including plasmonics, photonic circuits, quantum nano optics, optoelectronics and nano optical measurements of advanced telecommunications components Professor Lewis was awarded the Rank Prize in Optoelectronics by The J. Arthur Rank Foundation of London, England.
Professor Lewis is also the founder of Nanonics Imaging Ltd., that commercialized his developments in Near-field optics and pioneered the concept of integrating Atomic Force Microscopy with standard tools such as optical microscopes, Raman microscopes and Scanning Electron microscopes. The company is known for its innovative leadership in the industry including recent advances that have helped leapfrog barriers that have prevented, in the past, multiprobe scanned probe imaging.
| 
