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Nanonics is the only supplier of the entire spectrum of probes used in NSOM today. Our probes perform all current modes of NSOM operation and are breaking new ground with exciting new techniques.
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Exclusive cantilevered optical fiber probes
Nanonics holds the exclusive right to produce cantilevered optical fiber probes. In this pioneering probe technology, the fiber tip is bent and coated with metal. Therefore light can be transmitted to the aperture with the same efficiencies and polarization properties as those of conventional, straight near-field optical elements. As a result, near-field optics can benefit from the user-friendly normal-force feedback technique employed with much success in standard AFM systems.
Our straight NSOM probes are also ideal for performing simultaneous NSOM and shear-force AFM.
All our probes have the highest throughputs and can achieve the highest resolutions with apertures down to 50nm.
Nanonics range of NSOM probes includes all of the following:
- Cantilevered fiber probes
- Straight tapered fiber probes
- Silver and gold nanoparticle probes
- Probes with roughened probe tips coated with silver or gold
- Hollow normal force sensing probes
- Deep UV NSOM probes
- Polarization preserving NSOM probes with large extinction ratios
- Probes for producing nanometric shadow or reflection
- Active light sources and ion sensing NSOM probes
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| 1 x 1 micron AFM (left) and NSOM (right) images of 30nm gold balls taken in reflection mode |
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| 20x20 micron Reflection mode image of a magneto optic disk |
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| 12x12 micron Reflection mode image of a SRAM after CMP |
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| SEM of NSOM Probe tip with 100nm aperture |
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SEM profile of NSOM Probe |
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Left: The Nanonics Cantilevered NSOM probe opening the way to reflection NSOM imaging.
Schematic diagram of NSOM tip
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Optical Fiber NSOM Probe Specifications
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Wavelengths
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From IR to UV (350nm-1550nm)
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Aperture Diameter
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50nm - 5000nm
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Transmission
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10-5 - 10-1
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Coatings
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Cr (Thickness ~0.02µ), Al or Au (Thickness ~0.2µ)
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Input Power
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~5 mW (typical), ~20 mW (maximum)
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Connectors
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FC or bare
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Tip Length
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30 µm - 500 µm
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Cantilever Height
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50 µm - 500 µm (Deep Trench probes available)
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Cantilever Length
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300 µm - 1000µm
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Force Constant
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5-20 N/m
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Resonant Frequency
(for non-contact)
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80-390 kHz
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