| Optical Fiber AFM Probes |
Nanonics AFM glass probes are used for imaging surface topography with nanometric resolution and better characteristics than silicon atomic force sensors. Contact, non-contact, and intermittent contact probes are available for a variety of surfaces and for a range of materials and structures.
Nanonics Visible-Probe Tips are cantilevered probes, which use normal-force feedback and leave the probe tip exposed for maximum visibility. They have high aspect ratios (10:1) and can be customized to provide unique profiling possibilities.
Specialized AFM probes include:
- Deep Trench probes that can be used for imaging the bottom or side walls of deep pits.
- Hollow AFM probes that can be used as NanoFountainpens™ or for gas/liquid delivery and polymer molecular imaging.
- Electrical probes.
- Probes with hard to achieve force constants and resonant frequencies.
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Cantilevered AFM Probe: note that the angle of the
cantilever enables viewing the sample underneath the AFM tip
Sketch of AFM Probe
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1.4 x 1.4 micron AFM of Carbon Nanotube
z-range 15nm
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4.5 x 4.5 micron AFM image
z-range: 20nm
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Guidelines for Choosing Nanonics AFM Probe Characteristics Nanonics produces a large range of AFM tips with a variety of force constants and resonant frequencies. The table below provides guidelines to help you choose the probe best suited to your application.
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Application
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Mode
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Recommended Force Constant
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Recommended Resonant Frequency
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General Imaging
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Intermittent Contact
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3N/m
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25 - 80kHz
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Soft Biological Imaging
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Soft Intermittent Contact
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1N/m
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25 - 70kHz
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Light Tapping, Fluid Tapping
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Force Modulation
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5N/m
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30 - 80kHz
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Optical Fiber AFM Probe Specifications
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Tip diameter
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>10 nm
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Tip Length
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30 µm - 500 µm (Cantilevered);30 µm - 1000 µm (Straight)
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Cantilever Height
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50 µm - 500 µm (Deep Trench probes available)
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Cantilever Length
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300 µm - 1000 µm
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Force Constant
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>1-20 N/m
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Resonant Frequency
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20-390 kHz
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Phone: +972-2-6789573 |
Fax: +972-2-6480827 |
USA Toll Free (direct to sales): 1-800-289-7162 |
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