A) AFM topographic image of a cleaved multimode optical fiber obtained with AFM/NSOM probe.
B) A correlating NSOM image in collection mode obtained simultaneously with (A).
C) A 3D collage AFM/NSOM of the output optical distribution with exact correspondence to the surface’s topography.

• Near-field optical distribution of a multimode optical fiber launched with 532nm laser.
  
  
• The Nanonics' 3D FlatScan^TM stage allows for vertical mounting of the optical
  
  fiber with a flexible geometry for optical microscopy integrations.
  
  
• The sample is kept stationary along the scan to prevent any disturbance of the light propagation through the fiber. Nanonics systems with Tip-Scanning capabilities are ideal in such applications for true profiling of the optical output.
   
• The AFM/NSOM fully correlated imaging is based on tuning fork feedback in normal mode.

Nanonics Nano3D Distortion Free, Near-field/Far-field  Beam

Profiler

This novel product provides high precision, 50nm optical resolution with simultaneous topography and without deconvolution. 

• Unprecedented error-free profiling of divergent sources with no detector saturation or beam attenuation. 

• Seamless complex beam structures 3D profiles from the near-field to the far-field with overlapping fields of view.

Ideal systems for this application:

• MultiView 2000
  
  
  
• MultiView 4000

	An optical fiber vertically mounted on MultiView 2000TM SPM head integrated with an upright optical microscope