Far-field image of the edge of the waveguide obtained simultaneously
Collage of the Topography and Light Distribution gathered in collection mode   This image was produced with the MultiView 2000™ system. This is the only SPM system capable of perpendicular nanometric alignment of a waveguide to the sample. Light was then be transmitted though the waveguide. By scanning the NSOM/AFM probe on the surface of edge of the waveguide, light can be collected to produce images such as the one above.		Far-field image of the edge of the waveguide obtained simultaneously

Spatially Correlating the Launching of Light and the Resulting Emitted Mode Structure 

The images correlate the position of a near-field optical probe injecting light into a waveguide at one end and the resulting image at the other end of the waveguide as recorded with a video camera. As a control, the image in the upper center of the slide shows that when the probe is not over the waveguide no light is detected at the extreme end of the waveguide as seen in the lower middle image.