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Light Distribution Analysis with 0.05 Micron Spatial Resolution of Slab Waveguide Lasers Emitting at 1.5 Microns
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Active device structures can be readily characterized with Nanonics Systems. In such a slab waveguide laser the near and far-field have the axis of the elliptical distribution of light rotated.This is clearly seen for the first time using near-field optics to monitor the near-field and to use the same probe for far-field profiling.
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Near-field (a)/Far-field (b) light distribution:
A comparison
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Correlating charge distribution with light distribution below and above the lasing threshold:
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NSOM light distribution from the laser cavity with an injected current that is below the threshold for lasing action.
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NSOM light distribution from the laser cavity with an injected current that is above the threshold for lasing action.
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Injected charge distribution measured using the simultaneous atomic force capabilities with an injected current above the threshold for lasing action.
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