A: AFM topographic image of two slits on glass-coated gold surface imaged with AFM/NSOM fiber probe. The slits have 200nm width, 50nm thickness, 4µm length and 6µm separation.

B: NSOM image in collection mode with AFM/NSOM fiber probe (50nm aperture) shows transmitted light above the slits.

C: NSOM image shows the plasmons in the marked area between the two slits (see image B).

WSxM software has been used for image processing of the pictures above: I. Horcas et al. Rev. Sci. Instrum. 78, 013705 (2007).

• Nanonics’ MultiView systems with their tip-scanning capabilities and full integration with optical microscopes allow for efficient excitation and detection of plasmons. A dual optical microscope was used to obtain the above measurements. The lower microscope was used to excite the sample with a 532nm laser; the upper microscope was used to position the NSOM probe in the area of the slits.

 • AFM and NSOM images were simultaneously acquired with AFM/NSOM probe to obtain fully correlated topographic and NSOM data without any need to change the probe.

 • For the above measurements, it is critical to use tuning fork feedback to prevent any interference or background effects due to optical feedback.

Ideal systems for this application:

1. MultiView 2000
2. MultiView 4000
3. CryoView 2000