Tuesday, 12 August 2014 12:34

Nanonics at ICORS

Nanonics Imaging, the leaders in AFM-Raman-TERS integration and innovation will be exhibiting and speaking at the 2014 International Conference on Raman Spectroscopy (ICORS)meeting August 10-15, 2014 in Jena.  


 

Nanonics is presenting exciting talks describing our recent advances with our Multiview system:
  • Conducting simultaneous Raman with advanced SPM measurements on-line 
  • Integrating MultiProbe electrical measurements with on-line Raman.  
 
Come visit us in booth H5.2 to discuss your Raman interests and needs with our experts!

 

See below for presentations: 

ORAL:  PiezoForce and Contact Resonance Microscopy Correlated with Raman Spectroscopy applied to a Non-linear Optical Material and to a Lithium Battery Material
Monday, August 10th, 5:25pm; Lecture Hall 7
Session MoP -O-010:  Advanced Raman Instrumentation
 
POSTER:  Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene
Thursday, August 14th, 4:00-6:00pm; Lecture Hall HS 5
Session ThP-HS5-4: Tip-Enhanced and Near-Field Raman 
 
BOOTH:  Nanonics exhibiting in booth H5.2

 
 
 

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