Nanonics customer Dr. Nancy Haegel, of NREL, was profiled in SPIE for her work on transport imaging using photons to measure efficiency in solar cells. Dr. Haegel used a combined AFM-SEM for this groundbreaking work. More information on the Nanonics AFM/SEM/FIB instrument can be found on our website here. SPIE news profile of Dr. Haegel's work can be found here.