Monday, 04 January 2016 18:09

Nanonics customer profiled by SPIE for using a Nanonics AFM-SEM for optical transport work

Nanonics customer Dr. Nancy Haegel, of NREL, was profiled in SPIE for her work on transport imaging using photons to measure efficiency in solar cells.  Dr. Haegel used a combined AFM-SEM for this groundbreaking work.  More information on the Nanonics AFM/SEM/FIB instrument can be found on our website here.  SPIE news profile of Dr. Haegel's work can be found here.

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