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Hot off the Press!

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Nanonics is pleased to share with you the news of the recent publication of Conductive Atomic Force Microscopy: Applications in Nanomaterials, edited by Mario Lanza (Publisher: Wiley-VCH). The book includes a chapter entitled "Multiprobe Electrical Measurements without Optical Interference," written by Nanonics team members. This new publication will no doubt contribute greatly to the field of CAFM.

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