Monday, 25 September 2017 11:03

Hot off the Press!

Final cover HR

Nanonics is pleased to share with you the news of the recent publication of Conductive Atomic Force Microscopy: Applications in Nanomaterials, edited by Mario Lanza (Publisher: Wiley-VCH). The book includes a chapter entitled "Multiprobe Electrical Measurements without Optical Interference," written by Nanonics team members. This new publication will no doubt contribute greatly to the field of CAFM.

Do you have a question about a product?
Are you interested in a quote?
 

 

Great, please leave your name and email below,

and we will be in touch with you shortly to schedule a time.

What technique are you looking for? We're confident we have a solution for you.

 

 

 

Or simply contact us and one of our applied scientists will help guide you to the right product for your research or industry:

Contact Us
Get a customized quote for your research needs
 
Looks like Nanonics would be a great fit for your SPM research. Would you like to receive a customized quote?