Tuesday, 04 March 2014 13:15

February 2014 Newsletter

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February 2014 - In This Issue:
Research Focus: Scanning Thermal Microscopy
Specialized thermal probes
User News: SThM measures nanoscale heating around photonic devices
Nanonics at APS in Denver!
Meet Nanonics staff member Dr. Hesham Taha
 

Scanning Thermal Microscopy (SThM)

 

Scanning Thermal Microscopy (SThM) is a mode of atomic force microscopy where the local temperature and thermal conductivity are mapped simultaneously with topography.   Among its important applications are detection of phase changes, calorimetry, and discriminating materials.

 

SThM maps phenomena such as thermal expansion and thermal conductivity on the nanoscale, which can provide information on the chemical structure and can be a useful supplement for other measurements such as NSOM and near field Raman.

 

In this method, the probe is sensitive to local temperatures, with a common design - employed by Nanonics  - being a thermocouple probe where its  temperature is monitored by a thermocouple junction at the tip.  These probes thus provide combined topography and high resolution thermal images.  Especially when combined with the Nanonics multiprobe SPM design, nanoscale thermal characterization is possible using one probe to induce heating while the second probe monitors the heat propagation.

 

Nanonics has been a pioneer in the design and manufacture of specialized probes (see below) for these measurements for optimal experimental results. 

 

See examples of applications of scanning thermal microscopy on our website including our results on  thermal resistance  and conductivity imaging of a chip and of GaN nanowires.

 

Nanonics offers specialized probes for thermal measurements

 

Using over a decade's experience in manufacturing nanoprobes for a wide variety of sophisticated measurements, Nanonics manufactures thermocouple probes and dual-wire thermoresistive probes for thermal measurements.

 

The thermocouple probes (see schematic to right) consist of a tapered wire running through a metal-coated, glass nanopipette. The external metal coating extends over the protruding wire to create a junction across which the voltage drop is temperature dependent, with an incredibly fast time response enabling both static and dynamic thermal measurements in localized regions with high precision. Nanonics also provides thermoresistive probes that provide intermittent contact imaging of surfaces. 

 

All Nanonics probes feature a highly exposed tip for optical sensing with free optical access from above and below and are suitable for operation with all Nanonics systems including Multiprobe operation. Click here for more information on Nanonics probes.

 

USER NEWS - Scanning Thermal Microscopy measures nanoscale heating in photonic devices

  

As the miniaturization of photonic devices continues to drive down their dimensions and increase the data rates, heating and heat removal in these devices pose significant limitations to their further improvement and development.  Methods that can probe thermal conductivity and dissipation on the nanoscale are thus critical to future development and design of thermally stable devices that can be densely integrated on a chip.  The comparison of NSOM and thermal measurements enable characterization and comparison of the thermal distribution and optical profile.

 

Using a Nanonics Multiview 4000 Multiprobe system with Nanonics thermal probes, researchers Uriel Levy et al. (Optics Express, 2013, vol. 21, no. 24, p.  29195) have successfully measured  a temperature rise in a photonic device known as a silicon micro ring resonator (MRR) of approximately 10 degrees for power levels of 2mW in the waveguide. The authors hypothesize the self-heating is caused by free carrier absorption in the doped silicon.   This study shows that the role of MRR as building blocks in thermally stable Si photonic devices could be problematic unless future designs address this heating issue.

Thermal images of the doped Si MRR (a) in-resonance (b) out of resonance and (c) with laser turned off
Nanonics at APS
Visit us in Denver!  Nanonics scientists will be in booth 1008 and giving technical talks:
 

Thursday, March 6, 2014

Abstract: T24.00002    11:51-12:03 Room 504
"Multiprobe Electrical Measurements of Carbon Nanotubes with On-line Raman Scattering"
 
Abstract T24.00013     2:15-2:30  Room 504
"PiezoForce and Contact Resonance Microscopy Correlated with Raman Spectroscopy applied to a Non-linear Optical Material and to a Lithium Battery Material"
Meet Nanonics staff!
This month we profile Dr. Hesham Taha.
Current position at Nanonics: 

Hesham is Manager of Support and After Sales Services.

He has led a variety of R&D projects and performed dozens of installations globally of a variety of Nanonics systems.  Hesham enjoys interacting with customers and works closely with them on their experiments so they get the best use of their instruments.

Academic Background:  

Hesham holds a Ph.D in Applied Physics from the Hebrew University of Jerusalem in the field of SPM nanolithography.

Family:  Hesham is married to Sahar and they have a son.
Hobbies:  Fishing and horseback riding 

Where are you presenting your research?
Please let us know where you are presenting your research and we will be happy to share the news!