%PM, %05 %597 %2018 %13:%Mar

Nanonics Visits Los Angeles!

  Nanonics is pleased to be attending this year's APS March Meeting in Los Angeles!     We will be located at Booth #320 - Stop by to learn more about our leading AFM-Raman, TERS, and SECM solutions. Be sure…
%PM, %28 %587 %2017 %13:%Nov

Nanonics is in Boston!

  Nanonics is pleased to be attending this year's MRS Fall Meeting in Boston!     We will be located at Booth #817 - Stop by to learn more about our leading AFM-Raman and SECM solutions. Be sure to catch,…
%AM, %10 %351 %2017 %07:%Oct


Nanonics is thrilled to be represented by Flash-Photonics at this year's SCIX Conference. Come visit Booth 22 to learn more about AFM-Raman-TERS!  
%AM, %25 %502 %2017 %11:%Sep

Hot off the Press!

Nanonics is pleased to share with you the news of the recent publication of Conductive Atomic Force Microscopy: Applications in Nanomaterials, edited by Mario Lanza (Publisher: Wiley-VCH). The book includes a chapter entitled "Multiprobe Electrical Measurements without Optical Interference," written…
%AM, %26 %440 %2017 %09:%Jun

Support for MURI Funding Application

The deadline for the US Office of Naval Research MURI grant program is fast approaching. The Multidisciplinary University Research Initiatives (MURI) program is intended for "teams of researchers investigating high priority topics and opportunities that intersect more than one traditional…
The Israeli chip consortium, MDM - Multi Dimensional Metrology, will begin operating in July 2017. following approval by the Innovation Authority. The new consortium will deal with the development of measurement and process control technologies in the chip industry, based…
%AM, %08 %378 %2017 %08:%Jun

Nanonics at ICAVS9!

%AM, %19 %435 %2016 %09:%Dec

Nanonics 2017

Wishing you all the best for a happy holiday season!
%AM, %28 %518 %2016 %11:%Nov

Nanonics at MRS

 Visit Nanonics at MRS
%AM, %25 %381 %2016 %08:%Oct


Sale on NSOM Systems and Probes
%PM, %15 %682 %2016 %15:%Aug

Nanonics at NFO-14

Nanonics congratulates Y. Chen and Professors Olog Holtz, Jens Birch and Fredrik Karlsson of Linkoping University in Sweden on their recently published paper  "Determination of critical diameters for intrinsic carrier diffusion length of GaN nanorods with cryo-scanning near field- optical microscopy” (Scientific Reports, 6, p. 21482).  …
Dr Harshvardhan, Union Minister of Science and Technology, Government of India visited AGARKAR Research Institue to see an AFM demonstration on a Nanonics system. This system was purchased in 2004 and is still in use today. Since then, many Nanonics…
Do you have a question about a product?
Are you interested in a quote?


Great, please leave your name and email below,

and we will be in touch with you shortly to schedule a time.

What technique are you looking for? We're confident we have a solution for you.




Or simply contact us and one of our applied scientists will help guide you to the right product for your research or industry:

Contact Us