Tuesday, 28 November 2017 13:06

Nanonics is in Boston!

  Nanonics is pleased to be attending this year's MRS Fall Meeting in Boston!     We will be located at Booth #817 - Stop by to learn more about our leading AFM-Raman and SECM solutions. Be sure to catch,…
Tuesday, 10 October 2017 07:25


Nanonics is thrilled to be represented by Flash-Photonics at this year's SCIX Conference. Come visit Booth 22 to learn more about AFM-Raman-TERS!  
Monday, 25 September 2017 11:03

Hot off the Press!

Nanonics is pleased to share with you the news of the recent publication of Conductive Atomic Force Microscopy: Applications in Nanomaterials, edited by Mario Lanza (Publisher: Wiley-VCH). The book includes a chapter entitled "Multiprobe Electrical Measurements without Optical Interference," written…
Monday, 26 June 2017 09:34

Support for MURI Funding Application

The deadline for the US Office of Naval Research MURI grant program is fast approaching. The Multidisciplinary University Research Initiatives (MURI) program is intended for "teams of researchers investigating high priority topics and opportunities that intersect more than one traditional…
The Israeli chip consortium, MDM - Multi Dimensional Metrology, will begin operating in July 2017. following approval by the Innovation Authority. The new consortium will deal with the development of measurement and process control technologies in the chip industry, based…
Thursday, 08 June 2017 08:04

Nanonics at ICAVS9!

Monday, 19 December 2016 09:26

Nanonics 2017

Wishing you all the best for a happy holiday season!
Monday, 28 November 2016 11:27

Nanonics at MRS

 Visit Nanonics at MRS
Tuesday, 25 October 2016 08:09


Sale on NSOM Systems and Probes
Monday, 15 August 2016 15:22

Nanonics at NFO-14

Nanonics congratulates Y. Chen and Professors Olog Holtz, Jens Birch and Fredrik Karlsson of Linkoping University in Sweden on their recently published paper  "Determination of critical diameters for intrinsic carrier diffusion length of GaN nanorods with cryo-scanning near field- optical microscopy” (Scientific Reports, 6, p. 21482).  …
Dr Harshvardhan, Union Minister of Science and Technology, Government of India visited AGARKAR Research Institue to see an AFM demonstration on a Nanonics system. This system was purchased in 2004 and is still in use today. Since then, many Nanonics…
Nanonics customer Dr. Nancy Haegel, of NREL, was profiled in SPIE for her work on transport imaging using photons to measure efficiency in solar cells.  Dr. Haegel used a combined AFM-SEM for this groundbreaking work.  More information on the Nanonics AFM/SEM/FIB…

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