Nanonics’ MultiView 4000
Multi-Probe Scanned Probe Microscopy (SPM) Systems

Nanonics’ MV4000 multi-probe SPM systems allow independent scanning of four probes with ultra low noise in a variety of SPM imaging modalities.  The system allows upgrading from 1, to 2, 3 and ultimately 4 probes. Patented Nanonics ultra thin 3D FlatScannersTM are employed together with probes designed with exposed probe tips for intimate contact (within 10 nm).  Unprecedented Z range of 130 microns is provided with 160 microns in X and Y scanning.  Probes, as small as 5 nm, permit ultimate SPM resolution even with the multiprobe requirement for exposed probe geometries. Multiprobe systems allow for next generation electrical/thermal characterization and imaging of nanodevices with nanometric probe separations.  Free optical axis from above and below facilitates online optical and electron/ion optical characterization.  Thus, the MV4000 is readily integrated with confocal/micro-Raman imaging, opening new avenues for on-line chemical mapping and tip enhancement Raman (TERS) with multiple plasmonic probes.  In addition, non-linear optical second harmonic and 4pi microscopies are also permitted. Furthermore, an MV4000 fitted SEM/FIB allows for lamella nanoliftout and nanoelectronic device probing with SEM imaging.